{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T05:07:05Z","timestamp":1773378425819,"version":"3.50.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"National Research and Development Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT","award":["RS-2024-00402495 (100%)"],"award-info":[{"award-number":["RS-2024-00402495 (100%)"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3667776","type":"journal-article","created":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T20:57:49Z","timestamp":1772053069000},"page":"35894-35900","source":"Crossref","is-referenced-by-count":0,"title":["ES-SNN: e-Flash Memory-Based Stochastic Spiking Neural Networks for Edge Inference"],"prefix":"10.1109","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0510-3012","authenticated-orcid":false,"given":"Hyeyeon","family":"Jeon","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Seoul, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6457-727X","authenticated-orcid":false,"given":"Jungnam","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Seoul, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4837-8411","authenticated-orcid":false,"given":"Yoon","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Seoul, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2522-6754","authenticated-orcid":false,"given":"Minsuk","family":"Koo","sequence":"additional","affiliation":[{"name":"IM Electronics Company, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2018.12.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2979826"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2020.3009047"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TETCI.2018.2829924"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2022.3203583"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9181104"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3098671"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/5.622505"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.811702"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2023.3293026"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/mi14122190"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/BigData.2017.8257939"},{"key":"ref13","article-title":"Look-up table based neural networks for fast inference","author":"Traore","year":"2022"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3665314.3670804"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2024.3485178"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2024.3368849"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3170579"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3352729"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1587\/elex.21.20240194"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3232648"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11411680.pdf?arnumber=11411680","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T20:38:58Z","timestamp":1773347938000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11411680\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3667776","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}