{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T21:22:26Z","timestamp":1773696146277,"version":"3.50.1"},"reference-count":65,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3667991","type":"journal-article","created":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T20:57:49Z","timestamp":1772053069000},"page":"37416-37434","source":"Crossref","is-referenced-by-count":0,"title":["StabilEdge, Formal Verification of Edge AI Applications"],"prefix":"10.1109","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8092-5473","authenticated-orcid":false,"given":"Luca","family":"Lazzaroni","sequence":"first","affiliation":[{"name":"Department of Electrical, Electronic and Telecommunication Engineering (DITEN), University of Genoa, Genoa, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1937-3969","authenticated-orcid":false,"given":"Riccardo","family":"Berta","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Telecommunication Engineering (DITEN), University of Genoa, Genoa, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-2829-7859","authenticated-orcid":false,"given":"Vafali","family":"Soltanmuradov","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Telecommunication Engineering (DITEN), University of Genoa, Genoa, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3764-5083","authenticated-orcid":false,"given":"David","family":"Mart\u00edn G\u00f3mez","sequence":"additional","affiliation":[{"name":"Department of Systems Engineering and Automation, Leganés, Madrid, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4109-4675","authenticated-orcid":false,"given":"Francesco","family":"Bellotti","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Telecommunication Engineering (DITEN), University of Genoa, Genoa, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/access.2025.3530297"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/access.2025.3586940"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2025.110360"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/access.2025.3539392"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/access.2025.3570731"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.26599\/jicv.2023.9210039"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3620677"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tcss.2025.3530772"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3675392"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3674981"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/lsens.2025.3600982"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-90492-4"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-25540-4_26"},{"key":"ref14","article-title":"Fast and complete: Enabling complete neural network verification with rapid and massively parallel incomplete verifiers","volume-title":"Int. Conf. Learn. Represent","author":"Xu"},{"key":"ref15","article-title":"Beta-CROWN: Efficient bound propagation with per-neuron split constraints for complete and incomplete neural network robustness verification","author":"Wang","year":"2021","journal-title":"arXiv:2103.06624"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.2514\/6.2021-1580"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.trf.2024.06.012"},{"key":"ref18","article-title":"Formal verification of deep neural networks for object detection","author":"Elboher","year":"2024","journal-title":"arXiv:2407.01295"},{"key":"ref19","article-title":"Formal verification of CNN-based perception systems","author":"Kouvaros","year":"2018","journal-title":"arXiv:1811.11373"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-65630-9_13"},{"key":"ref21","article-title":"The fourth international verification of neural networks competition (VNN-COMP 2023): Summary and results","author":"Brix","year":"2023","journal-title":"arXiv:2312.16760"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ton.2025.3540640"},{"key":"ref23","article-title":"Mathematical programming models for exact and interpretable formulation of neural networks","author":"Ataei","year":"2025","journal-title":"arXiv:2504.14356"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.nahs.2025.101581"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3233\/faia200385"},{"key":"ref26","doi-asserted-by":"crossref","DOI":"10.5244\/C.35.356","article-title":"Bias field robustness verification of large neural image classifiers","volume-title":"BMVC","author":"Henriksen"},{"key":"ref27","article-title":"Efficient formal safety analysis of neural networks","author":"Wang","year":"2018","journal-title":"arXiv:1809.08098"},{"key":"ref28","article-title":"Complete verification via multi-neuron relaxation guided branch-and-bound","author":"Ferrari","year":"2022","journal-title":"arXiv:2205.00263"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tcss.2022.3179659"},{"key":"ref30","volume-title":"Gurobi Optimizer","year":"2025"},{"issue":"12","key":"ref31","first-page":"1","article-title":"Critically assessing the state of the art in neural network verification","volume":"25","author":"K\u00f6nig","year":"2024","journal-title":"J. Mach. Learn. Res."},{"key":"ref32","article-title":"SoundnessBench: A soundness benchmark for neural network verifiers","author":"Zhou","year":"2024","journal-title":"arXiv:2412.03154"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-83903-1_5"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/dasc66011.2025.11257223"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-33170-1_5"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-84100-2_17"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s10846-023-01808-3"},{"issue":"19","key":"ref38","first-page":"21152","article-title":"Towards efficient verification of quantized neural networks","volume-title":"Proc. AAAI Conf. Artif. Intell.","volume":"38","author":"Pei"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-91118-7_9"},{"key":"ref40","volume-title":"Lutzroeder\/Netron","author":"Roeder","year":"2025"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.1986.4767851"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.1979.4310076"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3318710"},{"key":"ref44","volume-title":"VL53L5CX | Product\u2014STMicroelectronics","year":"2025"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1145\/3485730.3493692"},{"key":"ref46","volume-title":"Far Infrared Thermal Sensor Array (32\u00d724 RES)","year":"2025"},{"key":"ref47","volume-title":"Max-Planck-Institut Fuer Biogeochemie\u2014Wetterdaten","year":"2025"},{"key":"ref48","volume-title":"C48_EN","year":"2025"},{"key":"ref49","volume-title":"Onnx\/Tensorflow-Onnx","year":"2025"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2021.03.091"},{"key":"ref51","volume-title":"PTB100","year":"2025"},{"key":"ref52","volume-title":"One Stop Wind Shop: Accredited Wind Measurement Equipment and Services","year":"2025"},{"key":"ref53","volume-title":"KIPP & Zonen CM 11 Instruction Manual PDF Download","year":"2025"},{"key":"ref54","volume-title":"Dew Point and Temperature Probe DMP8 | Vaisala","year":"2025"},{"key":"ref55","volume-title":"Datasheet_EE210","year":"2025"},{"key":"ref56","volume-title":"TLDAS Trace Moisture Analyzer, The Barracuda MODEL 4010LX","author":"Bates","year":"2025"},{"key":"ref57","volume-title":"KIPP & Zonen Par Lite Instruction Manual PDF Download","year":"2025"},{"key":"ref58","volume-title":"5.4032.35.007-011_5.4032.45.008-009_Precipitation_Transmitter_En","year":"2025"},{"key":"ref59","volume-title":"OTT Parsivel2\u2014Laser Weather Sensor","year":"2025"},{"key":"ref60","volume-title":"Licor_6262_Manual","year":"2025"},{"key":"ref61","volume-title":"CR1000X\u2014Measurement and Control Datalogger","year":"2025"},{"key":"ref62","volume-title":"VL53L7CX | Product\u2014STMicroelectronics","year":"2025"},{"key":"ref63","volume-title":"D6T | MEMS Thermal Sensors|OMRON Device & Module Solutions\u2014Europe","year":"2025"},{"key":"ref64","volume-title":"DHT11, DHT22 and AM2302 Sensors | Adafruit Learning System","year":"2025"},{"key":"ref65","volume-title":"Melanoma Skin Cancer Dataset of 10000 Images","year":"2025"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11411672.pdf?arnumber=11411672","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T20:16:27Z","timestamp":1773692187000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11411672\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":65,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3667991","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}