{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T19:09:23Z","timestamp":1780340963453,"version":"3.54.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3677576","type":"journal-article","created":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T19:57:30Z","timestamp":1774468650000},"page":"47012-47031","source":"Crossref","is-referenced-by-count":1,"title":["Automated Validation and Repair Framework for Converting Operational Distribution System Into Digital-Twin-Ready Simulation Models"],"prefix":"10.1109","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5930-025X","authenticated-orcid":false,"given":"Hasan","family":"Iqbal","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jawad","family":"Mohammed","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1179-438X","authenticated-orcid":false,"given":"Arif","family":"Sarwat","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-809597-3.00518-6"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2012.12.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2025.111608"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/c2016-0-04518-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/electronics14101998"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2025.3620279"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2798707"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TD39804.2020.9299977"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.10.001"},{"key":"ref10","doi-asserted-by":"crossref","DOI":"10.1016\/j.aei.2025.104124","article-title":"Taxonomy of digital twins for power grids","volume":"70","author":"Pavleska","year":"2026","journal-title":"Adv. Eng. Informat."},{"key":"ref11","first-page":"1980","article-title":"Distributed energy resources: A systematic literature review","volume-title":"Energy Rep.","volume":"13","author":"Adham","year":"2025"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDC.2018.8440470"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.segan.2025.101860"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2024.111284"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/OJIA.2024.3367547"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PESGM46819.2021.9638106"},{"key":"ref17","volume-title":"Introduction to OpenDSS","year":"2026"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1201\/9781315222424-27"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/NPSC.2016.7858959"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/WSC57314.2022.10015411"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3138990"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2022.10.328"},{"key":"ref23","volume-title":"Digital Twin\u2014Maturity Model and Guidance for a Maturity Assessment","year":"2025"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10207-023-00784-x"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.17775\/CSEEJPES.2018.01460"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MPE.2023.3324296"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/en15082836"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.2172\/1863540"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.rineng.2024.102741"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11456020.pdf?arnumber=11456020","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T06:08:44Z","timestamp":1775023724000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11456020\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3677576","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}