{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T18:51:20Z","timestamp":1780512680055,"version":"3.54.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3682635","type":"journal-article","created":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T19:47:46Z","timestamp":1775764066000},"page":"60593-60615","source":"Crossref","is-referenced-by-count":1,"title":["Risk-Aware Data Center BESS Dispatch With MILP, Machine Learning, and Stochastic Outage Simulations"],"prefix":"10.1109","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5930-025X","authenticated-orcid":false,"given":"Hasan","family":"Iqbal","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1179-438X","authenticated-orcid":false,"given":"Arif","family":"Sarwat","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.segan.2025.101920"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2018.2871125"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EI252483.2021.9713039"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2025.11.048"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PowerTech59965.2025.11180459"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICPRE62586.2024.10768566"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/PGES66344.2025.11193459"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/INTELEC63987.2025.11214771"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISGTMiddleEast65737.2025.11314272"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2025.119951"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2025.125858"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.17775\/CSEEJPES.2023.05550"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2025.111403"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2025.138509"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICESEP66633.2025.11155744"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/EESAT62935.2025.10891224"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ITEC55900.2023.10187040"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/GLOBECOM38437.2019.9013172"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2025.3568803"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/PIECON56912.2023.10085721"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2023.3321591"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEC60005.2024.10472283"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2025.3623107"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2025.11.098"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2025.110528"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.suscom.2025.101256"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/MELECON56669.2024.10608495"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3067951"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2025.124248"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.segan.2025.101680"},{"key":"ref31","volume-title":"Uptime Institute Global Data Center Survey Results 2025\u2013Uptime Institute","year":"2025"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2010.5618906"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11478398.pdf?arnumber=11478398","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T19:51:18Z","timestamp":1777319478000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11478398\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3682635","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}