{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,28]],"date-time":"2026-05-28T23:04:01Z","timestamp":1780009441835,"version":"3.53.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100003009","name":"Science and Technology Development Fund, Macao Special Administrative Region","doi-asserted-by":"publisher","award":["0029\/2022\/AGJ"],"award-info":[{"award-number":["0029\/2022\/AGJ"]}],"id":[{"id":"10.13039\/501100003009","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003009","name":"Science and Technology Development Fund, Macao Special Administrative Region","doi-asserted-by":"publisher","award":["0029\/2023\/RIA1"],"award-info":[{"award-number":["0029\/2023\/RIA1"]}],"id":[{"id":"10.13039\/501100003009","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Program of Guangdong","award":["2023A0505020003"],"award-info":[{"award-number":["2023A0505020003"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3686425","type":"journal-article","created":{"date-parts":[[2026,4,22]],"date-time":"2026-04-22T19:50:57Z","timestamp":1776887457000},"page":"76965-76977","source":"Crossref","is-referenced-by-count":0,"title":["Optimizing Incoming Quality Control With a Dynamic Set Covering Strategy for Zero-Defect Inspection"],"prefix":"10.1109","volume":"14","author":[{"given":"Wenqing","family":"Zhou","sequence":"first","affiliation":[{"name":"Institute of Systems Engineering, Macau University of Science and Technology, Taipa, Macau, SAR, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1568-3444","authenticated-orcid":false,"given":"Yufeng","family":"Chen","sequence":"additional","affiliation":[{"name":"Institute of Systems Engineering, Macau University of Science and Technology, Taipa, Macau, SAR, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1397-5512","authenticated-orcid":false,"given":"Rui","family":"Zhou","sequence":"additional","affiliation":[{"name":"Institute of Systems Engineering, Macau University of Science and Technology, Taipa, Macau, SAR, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6722-8366","authenticated-orcid":false,"given":"Mohamed","family":"Sharaf","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering, College of Engineering, King Saud University, Riyadh, Saudi Arabia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","first-page":"13","volume-title":"Introduction to Statistical Quality Control","author":"Montgomery","year":"2020"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1201\/9781482276350"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3520892"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1989.10488520"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/9781119606475"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/math13091449"},{"key":"ref7","first-page":"40","volume-title":"Optimal Reliability Modeling: Principles and Applications","author":"Kuo","year":"2003"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s11465-018-0499-5"},{"issue":"624","key":"ref9","first-page":"59","volume-title":"Statistical Learning Theory","volume":"1","author":"Vapnik","year":"1998"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2024.102442"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-99707-0_34"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-021-08104-0"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2016.2611649"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/app10134570"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2025.111340"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2019.1605228"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1080\/0951192X.2022.2081360"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/app122211487"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1108\/IJLSS-10-2023-0183"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2024.01.128"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/s17061440"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-024-02559-0"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3107902"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/automation6030037"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44778.2020.9325213"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MetroInd4.0IoT51437.2021.9488493"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2019.11.406"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2019.11.405"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/app12105184"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2893493"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN41052.2019.8972097"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-025-02571-y"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/s25051288"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13061090"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.3390\/polym16081113"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.17654\/DM019030289"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1117\/12.2603289"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2022.108534"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2024.08.436"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-024-00455-8"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11491858.pdf?arnumber=11491858","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,28]],"date-time":"2026-05-28T22:39:36Z","timestamp":1780007976000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11491858\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3686425","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}