{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T05:11:50Z","timestamp":1779167510380,"version":"3.51.4"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3691733","type":"journal-article","created":{"date-parts":[[2026,5,11]],"date-time":"2026-05-11T19:47:35Z","timestamp":1778528855000},"page":"73180-73188","source":"Crossref","is-referenced-by-count":0,"title":["Diff-Conformer: A Dual-Input Difference-Aware Convolutional Transformer Network for Building Change Detection"],"prefix":"10.1109","volume":"14","author":[{"given":"Shengchang","family":"Li","sequence":"first","affiliation":[{"name":"North Computer Application Technique Institute, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-6704-4600","authenticated-orcid":false,"given":"Shuo","family":"Chen","sequence":"additional","affiliation":[{"name":"North Computer Application Technique Institute, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-6219-4927","authenticated-orcid":false,"given":"Zipeng","family":"Fan","sequence":"additional","affiliation":[{"name":"North Computer Application Technique Institute, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zeyu","family":"Li","sequence":"additional","affiliation":[{"name":"North Computer Application Technique Institute, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zishuo","family":"Zhang","sequence":"additional","affiliation":[{"name":"North Computer Application Technique Institute, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinyu","family":"Yang","sequence":"additional","affiliation":[{"name":"North Computer Application Technique Institute, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sihao","family":"Zhang","sequence":"additional","affiliation":[{"name":"North Computer Application Technique Institute, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s12524-025-02188-x"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s12524-024-01883-5"},{"key":"ref3","article-title":"Building damage detection in satellite imagery using convolutional neural networks","author":"Xu","year":"2019","journal-title":"arXiv:1910.06444"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3434451"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2020.3037893"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0034-4257(97)00162-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/rs11131525"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jag.2022.102899"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-021-02721-8"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1561\/2000000039"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2767624"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2021.3056416"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2018.2869608"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TASL.2011.2109382"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.11.044"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/323533a0"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1989.1.4.541"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/rs11111382"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/ijgi8040189"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/rs11030240"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2021.3095166"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMRB.2023.3315479"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3360516"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/rs12101662"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2018.2858817"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2021.3085870"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2018.8451652"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2021.3066802"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.isprsjprs.2020.06.003"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12234823"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/s24041268"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11513858.pdf?arnumber=11513858","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T04:39:38Z","timestamp":1779165578000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11513858\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3691733","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}