{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,24]],"date-time":"2026-06-24T20:50:12Z","timestamp":1782334212326,"version":"3.54.5"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3699504","type":"journal-article","created":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T20:07:38Z","timestamp":1780430858000},"page":"91559-91581","source":"Crossref","is-referenced-by-count":0,"title":["Active Learning for Repairable Hardware Systems With Partial Coverage"],"prefix":"10.1109","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0378-1178","authenticated-orcid":false,"given":"Michael L.","family":"Potter","sequence":"first","affiliation":[{"name":"Northeastern University, Boston, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Beyza","family":"Kalkanli","sequence":"additional","affiliation":[{"name":"Northeastern University, Boston, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1114-3539","authenticated-orcid":false,"given":"Deniz","family":"Erdo\u011fmu\u015f","sequence":"additional","affiliation":[{"name":"Northeastern University, Boston, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9377-6745","authenticated-orcid":false,"given":"Michael","family":"Everett","sequence":"additional","affiliation":[{"name":"Northeastern University, Boston, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"The Biggest Medical Device Recalls in History","year":"2024"},{"key":"ref2","volume-title":"Medical Device Quality Assurance","year":"2024"},{"key":"ref3","article-title":"Overview of reliability-based design in automotive and aerospace engineering","author":"d\u2019Ippolito","year":"2007","journal-title":"7th World Congr. Struct. Multidisciplinary Optim."},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS51492.2024.10457828"},{"key":"ref5","volume-title":"Spacex Rocket Failure Cost Nasa $110 Million","author":"Petersen","year":"2015"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS48030.2020.9153633"},{"key":"ref7","article-title":"Active learning literature survey","author":"Settles","year":"2009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.strusafe.2021.102174"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2514\/1.34321"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.strusafe.2011.01.002"},{"key":"ref11","article-title":"Active learning for structural reliability analysis with multiple limit state functions through variance-enhanced PC-kriging surrogate models","author":"Morato","year":"2023","journal-title":"arXiv:2302.12074"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2024.110150"},{"issue":"2","key":"ref13","doi-asserted-by":"crossref","first-page":"51","DOI":"10.3390\/e18020051","article-title":"Classification active learning based on mutual information","volume":"18","author":"Sourati","year":"2016","journal-title":"Entropy"},{"key":"ref14","first-page":"1183","article-title":"Deep Bayesian active learning with image data","volume-title":"Proc. 34th Int. Conf. Mach. Learn.","volume":"70","author":"Gal"},{"key":"ref15","article-title":"Maximum likelihood reliability estimation from subsystem and full-system tests: Method overview and illustrative examples","author":"Maranzano","year":"2022"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2010.5531454"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1198\/073500107000000278"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2017.2743707"},{"key":"ref19","first-page":"7","article-title":"The value of unlabeled data for classification problems","volume-title":"Proc. 17th Int. Conf. Mach. Learn.","volume":"20","author":"Zhang"},{"key":"ref20","first-page":"1","article-title":"Practical Bayesian optimization of machine learning algorithms","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"25","author":"Snoek"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/aitest55621.2022.00012"},{"key":"ref22","volume-title":"The Key Stages of Asset Life Cycle Management","year":"2024"},{"key":"ref23","volume-title":"Engineering Statistics Handbook","year":"2000"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2002.804492"},{"key":"ref25","volume-title":"Introduction to Probability, Statistics, and Random Processes","author":"Pishro-Nik","year":"2014"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2013.08.006"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2008.09.006"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2675"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1016\/B978-0-08-096902-2.00008-8","article-title":"Chapter 8-methods of modeling","volume-title":"Reliability, Maintainability and Risk","author":"Smith","year":"2011"},{"key":"ref30","volume-title":"Failure Mode and Effect Analysis","author":"Stamatis","year":"2003"},{"key":"ref31","volume-title":"Product Certification Document","year":"2020"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.21236\/ADA256347"},{"key":"ref33","volume-title":"The ROI of Preventive Maintenance: Is It Really Worth It? Brightly\u2014A Siemens Company","year":"2024"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2022.11.024"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1080\/10556788.2017.1322081"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2007.4434608"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511804441"},{"issue":"83","key":"ref38","first-page":"1","article-title":"CVXPY: A Python-embedded modeling language for convex optimization","volume":"17","author":"Diamond","year":"2016","journal-title":"J. Mach. Learn. Res."},{"key":"ref39","doi-asserted-by":"crossref","first-page":"747","DOI":"10.1016\/B978-012524995-9\/50039-8","article-title":"15-failure and reliability of electronic materials and devices","volume-title":"Engineering Materials Science","author":"Ohring","year":"1995"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11547161.pdf?arnumber=11547161","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,24]],"date-time":"2026-06-24T19:51:49Z","timestamp":1782330709000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11547161\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3699504","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}