{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,3]],"date-time":"2026-08-03T20:11:14Z","timestamp":1785787874100,"version":"3.56.0"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Deanship of Scientific Research and Libraries at Princess Nourah bint Abdulrahman University through the Researchers Supporting Project","award":["PNURSP2026R719"],"award-info":[{"award-number":["PNURSP2026R719"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3716600","type":"journal-article","created":{"date-parts":[[2026,7,23]],"date-time":"2026-07-23T19:12:18Z","timestamp":1784833938000},"page":"114597-114616","source":"Crossref","is-referenced-by-count":0,"title":["Explainable Large-Scale Metallic Surface Defect Detection Using Modified YOLO Architecture for Sustainable Industrial Manufacturing"],"prefix":"10.1109","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1982-4117","authenticated-orcid":false,"given":"Fatimah","family":"Alhayan","sequence":"first","affiliation":[{"name":"Princess Nourah bint Abdulrahman University, P.O. Box 84428","place":["Riyadh, Saudi Arabia"],"department":["Department of Information Systems"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6356-0000","authenticated-orcid":false,"given":"Ashwag","family":"Albakri","sequence":"additional","affiliation":[{"name":"Jazan University","place":["Jazan, Saudi Arabia"],"department":["Department of Computer Science"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4897-8038","authenticated-orcid":false,"given":"Hadeel","family":"Alsolai","sequence":"additional","affiliation":[{"name":"Princess Nourah bint Abdulrahman University, P.O. Box 84428","place":["Riyadh, Saudi Arabia"],"department":["Department of Information Systems"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6252-1800","authenticated-orcid":false,"given":"Bayan","family":"Alabdullah","sequence":"additional","affiliation":[{"name":"Princess Nourah bint Abdulrahman University, P.O. Box 84428","place":["Riyadh, Saudi Arabia"],"department":["Department of Information Systems"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5662-6238","authenticated-orcid":false,"given":"Sarra","family":"Ayouni","sequence":"additional","affiliation":[{"name":"Princess Nourah bint Abdulrahman University, P.O. Box 84428","place":["Riyadh, Saudi Arabia"],"department":["Department of Information Systems"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"issue":"7","key":"ref1","first-page":"1261","article-title":"A review of metal surface defect detection based on computer vision","volume":"50","author":"Lin","year":"2024","journal-title":"Acta Automatica Sinica"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3544578"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3233\/FAIA241217"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-024-02483-3"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2025.119586"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1115\/1.4063860"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-023-05199-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1108\/RPJ-08-2024-0337"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11227-024-06662-0"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1186\/s40537-025-01226-2"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s13369-024-09230-z"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-95-4828-6_11"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-94936-9"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s25154817"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/electronics14102029"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/electronics14173401"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3581024"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3548198"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13071388"},{"key":"ref20","article-title":"Faster metallic surface defect detection using deep learning with channel shuffling","author":"Yasir","year":"2024","journal-title":"arXiv:2406.14582"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3378999"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3307753"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3470998"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52734.2025.02222"},{"key":"ref25","volume-title":"GC10-DET-metallic-surface-defect-dataset.","year":"2026"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/s20061562"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/s22030799"},{"issue":"2","key":"ref28","first-page":"1","article-title":"Improve image classification using data augmentation and neural networks","volume":"2","author":"Gu","year":"2019","journal-title":"SMU Data Sci. Rev."},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/app14041657"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3329713"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3390\/app12168117"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/coatings15091066"},{"issue":"12","key":"ref33","first-page":"4854","article-title":"Research on underwater target detection algorithm based on deep learning","volume":"52","author":"Xu","year":"2025","journal-title":"IAENG Int. J. Comput. Sci."},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/diagnostics13010072"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.32877\/bt.v8i2.3300"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13091778"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.bspc.2025.108636"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-31235-3"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3390\/electronics14010054"},{"key":"ref40","volume-title":"Metal surface defects dataset.","year":"2026"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.18280\/mmep.111113"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11622419.pdf?arnumber=11622419","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,8,3]],"date-time":"2026-08-03T19:16:32Z","timestamp":1785784592000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11622419\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3716600","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}