{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T16:00:36Z","timestamp":1774540836421,"version":"3.50.1"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,7,18]],"date-time":"2024-07-18T00:00:00Z","timestamp":1721260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,7,18]],"date-time":"2024-07-18T00:00:00Z","timestamp":1721260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,7,18]]},"DOI":"10.1109\/acirs62330.2024.10684895","type":"proceedings-article","created":{"date-parts":[[2024,9,25]],"date-time":"2024-09-25T17:28:14Z","timestamp":1727285294000},"page":"232-237","source":"Crossref","is-referenced-by-count":1,"title":["Surface Defect Detection of Workpieces Based on Deep Learning"],"prefix":"10.1109","author":[{"given":"Xuemei","family":"Zhang","sequence":"first","affiliation":[{"name":"Shenyang University of Chemical Technology,Liaoning Key Laboratory of Domestic Industrial Control Platform Technology on Basic Hardware&Software Liaoning Provincial Key Laboratory of Industrial Intelligent Technology for Chemical Processes,Shenyang,China"}]},{"given":"Zhenyu","family":"Yin","sequence":"additional","affiliation":[{"name":"Shenyang Institute of Computing Technology, Chinese Academy of Sciences University of Chinese Academy of Sciences,Liaoning Key Laboratory of Domestic Industrial Control Platform Technology on Basic Hardware&Software,Shenyang,China"}]},{"given":"Wei","family":"Gao","sequence":"additional","affiliation":[{"name":"Shenyang University of Chemical Technology,Liaoning Provincial Key Laboratory of Industrial Intelligent Technology for Chemical Processes,Shenyang,China"}]},{"given":"Xiaohui","family":"Wang","sequence":"additional","affiliation":[{"name":"Shenyang Institute of Computing Technology, Chinese Academy of Sciences University of Chinese Academy of Sciences,Liaoning Key Laboratory of Domestic Industrial Control Platform Technology on Basic Hardware&Software,Shenyang,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/safeprocess58597.2023.10295728"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CAC59555.2023.10450211"},{"key":"ref3","article-title":"Object detection in 20 years: A survey","author":"Zou","year":"2019","journal-title":"arXiv preprint at"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3788\/lop57.120005"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/iccv.2015.169"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/iccv.2017.322"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref9","article-title":"YOLOv3: An Incremental Improvement[J]","author":"Redmon","year":"2018","journal-title":"arXive-prints"},{"key":"ref10","article-title":"YOLOv4: Optimal Speed and Accuracy of Object Detection[J]","author":"Bochkovskiy","year":"2020"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCC51575.2020.9345042"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1111\/mice.12263"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2018.09.412"},{"issue":"10","key":"ref14","first-page":"362","article-title":"A study on the detection and implementation of metal material workpiece surface defects based on the improved Faster RCNN[J]","volume":"49","author":"Hong","year":"2020","journal-title":"Surface Technology"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01234-2_1"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2019.2938758"},{"key":"ref17","article-title":"MPDIoU: a loss for efficient and accurate bounding box regression[J]","author":"Siliang","year":"2023","journal-title":"arXiv preprint arXiv:2307.07662"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/cvprw50498.2020.00203"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2017.106"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2018.00913"}],"event":{"name":"2024 9th Asia-Pacific Conference on Intelligent Robot Systems (ACIRS)","location":"Dalian, China","start":{"date-parts":[[2024,7,18]]},"end":{"date-parts":[[2024,7,20]]}},"container-title":["2024 9th Asia-Pacific Conference on Intelligent Robot Systems (ACIRS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10684879\/10684867\/10684895.pdf?arnumber=10684895","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,26]],"date-time":"2024-09-26T06:40:23Z","timestamp":1727332823000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10684895\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7,18]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/acirs62330.2024.10684895","relation":{},"subject":[],"published":{"date-parts":[[2024,7,18]]}}}