{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T21:28:57Z","timestamp":1725658137746},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/afrcon.2017.8095662","type":"proceedings-article","created":{"date-parts":[[2017,11,28]],"date-time":"2017-11-28T16:04:21Z","timestamp":1511885061000},"page":"1255-1259","source":"Crossref","is-referenced-by-count":1,"title":["Voltage stability index based on standard deviation-mean ratio for identification of weak nodes"],"prefix":"10.1109","author":[{"given":"Adedayo Ademola","family":"Yusuff","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7796(02)00093-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/ip-c.1991.0064"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2011.0530"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2012.07.010"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2011.06.008"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2015.1544"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2015.05.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2012.2118"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2009.09.003"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TD-ASIA.2009.5356950"}],"event":{"name":"2017 IEEE AFRICON","start":{"date-parts":[[2017,9,18]]},"location":"Cape Town","end":{"date-parts":[[2017,9,20]]}},"container-title":["2017 IEEE AFRICON"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8085624\/8095433\/08095662.pdf?arnumber=8095662","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T19:39:54Z","timestamp":1513193994000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8095662\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/afrcon.2017.8095662","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}