{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T22:35:57Z","timestamp":1729636557708,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/afrcon.2017.8095707","type":"proceedings-article","created":{"date-parts":[[2017,11,28]],"date-time":"2017-11-28T11:04:21Z","timestamp":1511867061000},"page":"1520-1521","source":"Crossref","is-referenced-by-count":0,"title":["Tunable aperture controlled by thermal expansion of copper beams"],"prefix":"10.1109","author":[{"given":"Keewoong","family":"Haan","sequence":"first","affiliation":[]},{"given":"Kukjin","family":"Chun","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"A fully integrated optofluidic micro-iris","author":"feuerstein","year":"2012","journal-title":"Micro Electro Mechanical Systems (MEMS)"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"515","DOI":"10.1016\/S0304-3886(01)00048-1","article-title":"A micro-aperture electrostatic field mill based on MEMS technology","volume":"51 52","author":"stone","year":"2001","journal-title":"Journal of Electrostatics"},{"key":"ref6","first-page":"2032","article-title":"Variable aperture stop based on the design of a single chamber silicone membrane lens with integrated actuation","volume":"36","author":"jan","year":"0","journal-title":"Optics Letters"},{"key":"ref5","article-title":"Tunable-focus liquid microlens array using dielectrophoretic effect","volume":"16","author":"wu","year":"0","journal-title":"OSA 2008"},{"journal-title":"Development of a single lens dual-aperture stereo imaging for an application in stereo endoscope","year":"2012","author":"bae","key":"ref2"},{"journal-title":"Dual Aperture Photography Image and Depth from a Mobile Camera","year":"2015","author":"manuel","key":"ref1"}],"event":{"name":"2017 IEEE AFRICON","start":{"date-parts":[[2017,9,18]]},"location":"Cape Town, South Africa","end":{"date-parts":[[2017,9,20]]}},"container-title":["2017 IEEE AFRICON"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8085624\/8095433\/08095707.pdf?arnumber=8095707","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,6]],"date-time":"2019-10-06T20:13:29Z","timestamp":1570392809000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8095707\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/afrcon.2017.8095707","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}