{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T09:41:52Z","timestamp":1730194912882,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,20]],"date-time":"2023-09-20T00:00:00Z","timestamp":1695168000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,20]],"date-time":"2023-09-20T00:00:00Z","timestamp":1695168000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,20]]},"DOI":"10.1109\/africon55910.2023.10293660","type":"proceedings-article","created":{"date-parts":[[2023,10,31]],"date-time":"2023-10-31T17:45:54Z","timestamp":1698774354000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Analysis of the Impact of Improper Termination and Grounding of Substation Cables"],"prefix":"10.1109","author":[{"given":"Jabu","family":"Mahlangu","sequence":"first","affiliation":[{"name":"Electrical and Electronics Engineering, Tshwane University of Technology,Emalahleni,South Africa"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aloys O","family":"Akumu","sequence":"additional","affiliation":[{"name":"Electrical and Electronics Engineering, Tshwane University of Technology,Emalahleni,South Africa"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Agha Francis","family":"Nnachi","sequence":"additional","affiliation":[{"name":"Electrical and Electronics Engineering, Tshwane University of Technology,Emalahleni,South Africa"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bolanle T","family":"Abe","sequence":"additional","affiliation":[{"name":"Electrical and Electronics Engineering, Tshwane University of Technology,Emalahleni,South Africa"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref8","article-title":"Power-Frequency Voltage Withstand Characteristics of Insulations of Substation Secondary System","volume":"2","author":"jinliang","year":"2010","journal-title":"IEEE Transactions on Power Delivery"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"5010","DOI":"10.1109\/TIA.2015.2427121","article-title":"Maximum Limit of Allowable Ground Potential Rise of Substation Grounding System","volume":"51","author":"jinliang","year":"2015","journal-title":"IEEE Transactions on Industry Applications"},{"key":"ref12","article-title":"Coupling to Shield Cables","author":"vance","year":"1929","journal-title":"A Wiley-Interscience Publication"},{"key":"ref9","first-page":"734","article-title":"Power frequency voltage with stand characteristics of insulations of substation secondary systems","volume":"52","author":"he","year":"2010","journal-title":"IEEE Transactions on Industry Applications"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2018.8393957"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.844303"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.1977.7567167"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2003.1236725"},{"year":"0","key":"ref5"},{"journal-title":"IEEE","article-title":"1143-1994 - IEEE Guide on Shielding Practice for Low Voltage Cables","year":"1995","key":"ref10"},{"key":"ref2","first-page":"404","article-title":"Current and Voltage Behaviour During a Fault in a HV\/MV System: Methods and Measurements","author":"napoli","year":"2015","journal-title":"IEEE"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"734","DOI":"10.1109\/TPWRD.2009.2037231","article-title":"Power-Frequency Voltage Withstand Characteristics of Insulations of Substation Secondary Systems","volume":"25","author":"hanqing","year":"2010","journal-title":"IEEE Transactions on Power Delivery"}],"event":{"name":"2023 IEEE AFRICON","start":{"date-parts":[[2023,9,20]]},"location":"Nairobi, Kenya","end":{"date-parts":[[2023,9,22]]}},"container-title":["2023 IEEE AFRICON"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10293181\/10293212\/10293660.pdf?arnumber=10293660","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,27]],"date-time":"2023-11-27T19:25:10Z","timestamp":1701113110000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10293660\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,20]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/africon55910.2023.10293660","relation":{},"subject":[],"published":{"date-parts":[[2023,9,20]]}}}