{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,10]],"date-time":"2026-06-10T16:34:32Z","timestamp":1781109272323,"version":"3.54.1"},"reference-count":52,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1109\/ahs.2010.5546257","type":"proceedings-article","created":{"date-parts":[[2010,8,18]],"date-time":"2010-08-18T14:21:48Z","timestamp":1282141308000},"page":"215-222","source":"Crossref","is-referenced-by-count":82,"title":["Process reliability based trojans through NBTI and HCI effects"],"prefix":"10.1109","author":[{"given":"Y.","family":"Shiyanovskii","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"F.","family":"Wolff","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"A.","family":"Rajendran","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"C.","family":"Papachristou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"D.","family":"Weyer","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"W.","family":"Clay","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","article-title":"Implementation of fast wafer level reliability monitoring strategy for wafter fab process monitoring","author":"yung","year":"2007","journal-title":"Student Conference on Research and Development (SCOReD)"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/PHM.2008.4711419"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.23"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/COMMAD.2006.4429941"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2004.1274005"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.174"},{"key":"ref36","doi-asserted-by":"crossref","first-page":"469","DOI":"10.1109\/TR.2002.804494","article-title":"Practical “building-in reliability” approaches for semiconductor manufacturing","volume":"51","author":"chien","year":"2002","journal-title":"IEEE Trans on Reliability"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2002.802660"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.1992.363266"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/STHERM.2005.1412184"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2007.81"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391560"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2008.4505310"},{"key":"ref1","article-title":"Trust in integrated circuits (tic)","author":"collins","year":"2007","journal-title":"DARPA Solicitation BAA 07–24"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/55.192874"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2007.4378050"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.04.027"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/16.735728"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1995.499312"},{"key":"ref25","first-page":"1","article-title":"Scaled cmos technology reliability users guide","author":"white","year":"2008","journal-title":"JPL Publication 08–14 3\/08 Jet Propulsion Laboratory California Institute of Technology Pasadena California"},{"key":"ref50","first-page":"1","article-title":"Chip problems haunt nvidia, pc makers","author":"clark","year":"2008","journal-title":"Wall Street Journal (8\/19\/08)"},{"key":"ref51","first-page":"1","article-title":"Nvidia takes charge for bad chips, but who is to blame?","author":"lapedus","year":"2008"},{"key":"ref52","first-page":"1","article-title":"Updated: Xilinx issues spartan-3 recall","author":"mcgrath","year":"2006"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-4079(09)61763-2"},{"key":"ref11","first-page":"1","article-title":"Supply chain risk management (scrm) to improve the integrity of components used in dod systems","year":"2010","journal-title":"Directive-Type Memorandum DTM-09-016 (Deparment of Defense)"},{"key":"ref40","article-title":"Hardware Trojan by Hot Carrier Injection","author":"shiyanovskii","year":"2009","journal-title":"ArXiv e-prints"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.41.2423"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269295"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"key":"ref15","first-page":"1047","article-title":"Modeling and minimization of pmos nbti effect for robust nanometer design","author":"vattikonda","year":"2006","journal-title":"Proceedings of the 43rd Annual Conference on Design Automation (DAC'06)"},{"key":"ref16","article-title":"Failure mechanisms and models for semiconductor devices","year":"2009","journal-title":"JEDEC Solid state Technology Association"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1998.670509"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.915629"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/55.192772"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2007.36"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403703"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2009.5224966"},{"key":"ref5","first-page":"1","article-title":"A sensitivity analysis of power signal methods for detecting hardware trojans under real process and environmental conditions","volume":"pp","author":"rad","year":"2009","journal-title":"IEEE Trans on Very Large Scale Integration (VLSI) Systems"},{"key":"ref8","article-title":"Exploiting Semiconductor Properties for Hardware Trojans","author":"shiyanovskii","year":"2009","journal-title":"ArXiv e-prints"},{"key":"ref7","article-title":"Mero: A statistical approach for hardware trojan detection","author":"chakraborty","year":"2009","journal-title":"11th International Workshop Cryptographic Hardware and Embedded Systems (CHES'09) Lecture Notes in Computer Science 5747 (Springer)"},{"key":"ref49","first-page":"1","article-title":"Glitch prompts intel to recall 1.13-ghz pentiums","author":"fried","year":"2000"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2009.2016954"},{"key":"ref46","first-page":"1","article-title":"Faulty capacitor prompts pacemaker recall","author":"lapedus","year":"2006"},{"key":"ref45","first-page":"1","article-title":"Pcs plagued by bad capacitors","author":"singer","year":"2005"},{"key":"ref48","first-page":"1","article-title":"Intel finds flaw in some new chip sets","author":"merritt","year":"2004"},{"key":"ref47","first-page":"1","article-title":"The truth about last year's xbox 360 recall","author":"yoshida","year":"2008"},{"key":"ref42","first-page":"338","article-title":"Parameter variations and impact on circuits and microarchitecture","author":"borkar","year":"0","journal-title":"Proc Design Automation Conf (DAC '03)"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.07.009"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.156"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.850834"}],"event":{"name":"2010 NASA\/ESA Conference on Adaptive Hardware and Systems (AHS)","location":"Anaheim, CA, USA","start":{"date-parts":[[2010,6,15]]},"end":{"date-parts":[[2010,6,18]]}},"container-title":["2010 NASA\/ESA Conference on Adaptive Hardware and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5535249\/5546215\/05546257.pdf?arnumber=5546257","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T08:49:51Z","timestamp":1497862191000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5546257\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6]]},"references-count":52,"URL":"https:\/\/doi.org\/10.1109\/ahs.2010.5546257","relation":{},"subject":[],"published":{"date-parts":[[2010,6]]}}}