{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T13:56:13Z","timestamp":1777470973566,"version":"3.51.4"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,8]]},"DOI":"10.1109\/ahs.2018.8541474","type":"proceedings-article","created":{"date-parts":[[2018,11,23]],"date-time":"2018-11-23T00:15:58Z","timestamp":1542932158000},"page":"120-126","source":"Crossref","is-referenced-by-count":10,"title":["A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs"],"prefix":"10.1109","author":[{"given":"Luca","family":"Sterpone","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sarah","family":"Azimi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ludovica","family":"Bozzoli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Boyang","family":"Du","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thomas","family":"Lange","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maximilien","family":"Glorieux","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dan","family":"Alexandrescu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cesar Boatella","family":"Polo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David Merodio","family":"Codinachs","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653592"},{"key":"ref11","year":"2018","journal-title":"Ultrascale architecture and product data sheet Overview"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.1998.731500"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2456101"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2014.6873681"},{"key":"ref15","year":"2018","journal-title":"UltraScale Architecture Soft Error Mitigation Controller (PG187)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2000850"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2015.7251378"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2620940"},{"key":"ref6","first-page":"588","article-title":"A new approach to detect-mitigatecorrect radiation-induced faults for SRAM-based FPGAs in aerospace application","author":"li","year":"2000","journal-title":"Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2015.7336736"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1268908"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2033381"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"4b.1.1","DOI":"10.1109\/IRPS.2015.7112728","article-title":"Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices","author":"lee","year":"2015","journal-title":"IEEE Reliability Physics Symposium 2015"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2218128"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2620165"}],"event":{"name":"2018 NASA\/ESA Conference on Adaptive Hardware and Systems (AHS)","location":"Edinburgh","start":{"date-parts":[[2018,8,6]]},"end":{"date-parts":[[2018,8,9]]}},"container-title":["2018 NASA\/ESA Conference on Adaptive Hardware and Systems (AHS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8515683\/8541365\/08541474.pdf?arnumber=8541474","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T13:51:46Z","timestamp":1643291506000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8541474\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,8]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/ahs.2018.8541474","relation":{},"subject":[],"published":{"date-parts":[[2018,8]]}}}