{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T18:32:06Z","timestamp":1771698726085,"version":"3.50.1"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100010002","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100010002","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100000780","name":"European Commission","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000780","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,22]]},"DOI":"10.1109\/aicas59952.2024.10595884","type":"proceedings-article","created":{"date-parts":[[2024,7,19]],"date-time":"2024-07-19T17:30:48Z","timestamp":1721410248000},"page":"408-412","source":"Crossref","is-referenced-by-count":1,"title":["Vibration may Break the Conductive Filament in amorphous Germanium based Memristor"],"prefix":"10.1109","author":[{"given":"Zidu","family":"Li","sequence":"first","affiliation":[{"name":"University of Siegen,Institute of Analogue Circuits and Image Sensors,Siegen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Phil David","family":"B\u00f6rner","sequence":"additional","affiliation":[{"name":"University of Siegen,Institute of Analogue Circuits and Image Sensors,Siegen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maurice","family":"M\u00fcller","sequence":"additional","affiliation":[{"name":"University of Siegen,Institute of High Frequency and Quantum Electronics,Siegen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andreas","family":"Bablich","sequence":"additional","affiliation":[{"name":"University of Siegen,Institute of Graphene-Based Nanotechnology,Siegen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peter Haring","family":"Bol\u00edvar","sequence":"additional","affiliation":[{"name":"University of Siegen,Institute of High Frequency and Quantum Electronics,Siegen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bhaskar","family":"Choubey","sequence":"additional","affiliation":[{"name":"University of Siegen,Institute of Analogue Circuits and Image Sensors,Siegen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2016.2583673"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2013.2296777"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-04484-2"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS202256217.2022.9971115"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614620"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201103119"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2016.2547718"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.3294625"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/s41578-019-0159-3"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms1737"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3144373"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.3077310"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0204-7"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/NANO54668.2022.9928635"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2018.2843162"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.3623485"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.4797488"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838370"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201401304"}],"event":{"name":"2024 IEEE 6th International Conference on AI Circuits and Systems (AICAS)","location":"Abu Dhabi, United Arab Emirates","start":{"date-parts":[[2024,4,22]]},"end":{"date-parts":[[2024,4,25]]}},"container-title":["2024 IEEE 6th International Conference on AI Circuits and Systems (AICAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10595550\/10595552\/10595884.pdf?arnumber=10595884","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,20]],"date-time":"2024-07-20T05:04:50Z","timestamp":1721451890000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10595884\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,22]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/aicas59952.2024.10595884","relation":{},"subject":[],"published":{"date-parts":[[2024,4,22]]}}}