{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T17:48:10Z","timestamp":1725472090174},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/aim.2018.8452302","type":"proceedings-article","created":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T20:29:07Z","timestamp":1536352147000},"page":"125-130","source":"Crossref","is-referenced-by-count":1,"title":["Sequential Cycloid Scanning for Time-resolved Atomic Force Microscopy"],"prefix":"10.1109","author":[{"given":"Nastaran","family":"Nikooienejad","sequence":"first","affiliation":[]},{"given":"Afshin","family":"Alipour","sequence":"additional","affiliation":[]},{"given":"Mohammad","family":"Maroufi","sequence":"additional","affiliation":[]},{"given":"S. O. Reza","family":"Moheimani","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2016.2615327"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2015.7171871"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(76)90006-6"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2014.2345098"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2504846"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2016.7526837"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2008.2001375"},{"journal-title":"Digital Signal Processing (4th Edition)","year":"2006","author":"proakis","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2015.2426180"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.4725525"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.4765048"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2015.2508979"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.4907908"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CCTA.2017.8062452"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2016.2574892"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/23\/6\/062001"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nature09450"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/21\/36\/365503"}],"event":{"name":"2018 IEEE\/ASME International Conference on Advanced Intelligent Mechatronics (AIM)","start":{"date-parts":[[2018,7,9]]},"location":"Auckland","end":{"date-parts":[[2018,7,12]]}},"container-title":["2018 IEEE\/ASME International Conference on Advanced Intelligent Mechatronics (AIM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8425581\/8452219\/08452302.pdf?arnumber=8452302","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T04:18:40Z","timestamp":1598242720000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8452302\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/aim.2018.8452302","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}