{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T09:35:32Z","timestamp":1747733732353},"reference-count":34,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,7,12]],"date-time":"2021-07-12T00:00:00Z","timestamp":1626048000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,7,12]],"date-time":"2021-07-12T00:00:00Z","timestamp":1626048000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,7,12]],"date-time":"2021-07-12T00:00:00Z","timestamp":1626048000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,7,12]]},"DOI":"10.1109\/aim46487.2021.9517484","type":"proceedings-article","created":{"date-parts":[[2021,8,24]],"date-time":"2021-08-24T16:58:48Z","timestamp":1629824328000},"page":"110-115","source":"Crossref","is-referenced-by-count":2,"title":["The Sensitivity of Subsurface Contact Resonance Atomic Force Microscopy to Changes in the Depth of Buried Features: a Nonlinear Approach"],"prefix":"10.1109","author":[{"given":"M.M.","family":"Hoogesteger","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Sadeghian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Nijmeijer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1016\/j.ultramic.2016.07.018"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1088\/1361-6463\/aa7024"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1063\/1.2936881"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1006\/jcis.1997.4984"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1063\/1.2743908"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1111\/jmi.12398"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1088\/0957-4484\/24\/36\/365701"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.ultramic.2013.07.008"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/j.ultramic.2013.04.003"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1063\/1.5113567"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.ultramic.2017.09.005"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1117\/12.2302959"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1557\/adv.2018.100"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1088\/1361-648X\/aa5b4a"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1063\/1.1626008"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1063\/1.4981537"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TNANO.2010.2053556"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1016\/j.ultramic.2011.05.009"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1063\/1.2987460"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1063\/1.111524"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1063\/1.5140427"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1143\/JJAP.32.L1095"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.ultramic.2010.02.015"},{"year":"2018","author":"jiriyaeisharahi","journal-title":"Mechanisms of Subsurface Imaging and Friction Reduction using Ultrasonic Atomic Force Microscopy","key":"ref7"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1126\/science.1117694"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1007\/s12274-015-0728-8"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1063\/5.0035151"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1088\/1361-6528\/ab10b1"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1103\/PhysRevB.69.085412"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.3762\/bjnano.10.159"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1039\/C5SM02154E"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1088\/0957-4484\/27\/41\/415707"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.3762\/bjnano.4.96"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1088\/0957-4484\/27\/27\/275703"}],"event":{"name":"2021 IEEE\/ASME International Conference on Advanced Intelligent Mechatronics (AIM)","start":{"date-parts":[[2021,7,12]]},"location":"Delft, Netherlands","end":{"date-parts":[[2021,7,16]]}},"container-title":["2021 IEEE\/ASME International Conference on Advanced Intelligent Mechatronics (AIM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9517313\/9517081\/09517484.pdf?arnumber=9517484","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T11:45:08Z","timestamp":1652183108000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9517484\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,7,12]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/aim46487.2021.9517484","relation":{},"subject":[],"published":{"date-parts":[[2021,7,12]]}}}