{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,26]],"date-time":"2026-01-26T01:53:05Z","timestamp":1769392385077,"version":"3.49.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,7,15]],"date-time":"2024-07-15T00:00:00Z","timestamp":1721001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,7,15]],"date-time":"2024-07-15T00:00:00Z","timestamp":1721001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001863","name":"New Energy and Industrial Technology Development Organization","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001863","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,7,15]]},"DOI":"10.1109\/aim55361.2024.10637188","type":"proceedings-article","created":{"date-parts":[[2024,8,22]],"date-time":"2024-08-22T17:52:35Z","timestamp":1724349155000},"page":"512-517","source":"Crossref","is-referenced-by-count":3,"title":["Description Method and Failure Ontology for Utilizing Maintenance Logs with FMEA in Failure Cause Inference of Manufacturing Systems"],"prefix":"10.1109","author":[{"given":"Takuma","family":"Fujiu","sequence":"first","affiliation":[{"name":"The University of Tokyo,School of Engineering,Department of Precision Engineering,Tokyo,Japan,113-8656"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshinori","family":"Yasui","sequence":"additional","affiliation":[{"name":"DENSO CORPORATION,Aichi,Japan,448-8661"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sho","family":"Okazaki","sequence":"additional","affiliation":[{"name":"The University of Tokyo,School of Engineering,Department of Precision Engineering,Tokyo,Japan,113-8656"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kohei","family":"Kaminishi","sequence":"additional","affiliation":[{"name":"The University of Tokyo,Research into Artifacts, Center for Engineering, School of Engineering,Tokyo,Japan,113-8656"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jun","family":"Ota","sequence":"additional","affiliation":[{"name":"The University of Tokyo,Research into Artifacts, Center for Engineering, School of Engineering,Tokyo,Japan,113-8656"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-020-06425-0"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4842-6552-9"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2011.06.001"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2014.10.001"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.15837\/ijccc.2016.4.1674"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3233\/aic-1994-7104"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CASE.2011.6042442"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/AIM46323.2023.10196264"},{"key":"ref9","article-title":"Preventing failures by mining maintenance logs with case-based reasoning","volume-title":"Proceedings of the 59th meeting of the society for machinery failure prevention technology (MFPT-59)","author":"Devaney"},{"key":"ref10","volume-title":"A Practical Guide to SysML","author":"Friedenthal","year":"2009"}],"event":{"name":"2024 IEEE\/ASME International Conference on Advanced Intelligent Mechatronics (AIM)","location":"Boston, MA, USA","start":{"date-parts":[[2024,7,15]]},"end":{"date-parts":[[2024,7,19]]}},"container-title":["2024 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10636941\/10636942\/10637188.pdf?arnumber=10637188","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T04:29:10Z","timestamp":1725251350000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10637188\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7,15]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/aim55361.2024.10637188","relation":{},"subject":[],"published":{"date-parts":[[2024,7,15]]}}}