{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:17:56Z","timestamp":1729621076404,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/aipr.2003.1284253","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T20:06:22Z","timestamp":1089317182000},"page":"81-86","source":"Crossref","is-referenced-by-count":1,"title":["Superresolution from image sequence"],"prefix":"10.1109","author":[{"given":"N.K.","family":"Bose","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1006\/jvci.1993.1030"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/1049-9652(91)90045-L"},{"article-title":"Superresolution from Degraded Image Sequence Using Spatial Tessellations and Wavelets","year":"2003","author":"lertrattanapanich","key":"ref10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1029\/GL014i002p00139"},{"key":"ref11","first-page":"422","article-title":"Ten good reasons for using spline wavelets","author":"unser","year":"1997","journal-title":"Proc SPIE Conf Math Imaging Wavelet Applications in Signal and Image Processing V"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/BF01200891"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2003.1203210"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2002.806234"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"197","DOI":"10.1049\/ip-f-2.1990.0030","article-title":"reconstruction of 2-d bandlimited discrete signals from nonuniform samples","volume":"137","author":"kim","year":"1990","journal-title":"Radar and Signal Processing IEE Proceedings F"},{"article-title":"Multidimensional Systems Theory and Applications","year":"2003","author":"bose","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/29.56062"}],"event":{"name":"32nd Applied Imagery Pattern Recognition Workshop, 2003.","location":"Washington, DC, USA"},"container-title":["32nd Applied Imagery Pattern Recognition Workshop, 2003. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9032\/28661\/01284253.pdf?arnumber=1284253","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T08:39:59Z","timestamp":1497602399000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1284253\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/aipr.2003.1284253","relation":{},"subject":[]}}