{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T09:55:49Z","timestamp":1730195749988,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,10]]},"DOI":"10.1109\/aipr.2011.6176350","type":"proceedings-article","created":{"date-parts":[[2012,4,5]],"date-time":"2012-04-05T13:58:46Z","timestamp":1333634326000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Sparse linearized iterative coherence estimation (SLICE) and risk assessment in image analysis"],"prefix":"10.1109","author":[{"given":"Robert J.","family":"Bonneau","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sonya G.","family":"Bonneau","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Statistical Signal Processing","year":"1991","author":"scharf","key":"19"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1093\/lpr\/mgm040"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1030563977"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.2307\/1390657"},{"journal-title":"A Wavelet Tour of Signal Processing","year":"1999","author":"mallat","key":"15"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/78.258082"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.2307\/1390705"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/78.340778"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/NRC.1996.510697"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1007\/s00041-008-9044-y"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176345632"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2006.1655936"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2005.845428"},{"key":"2","article-title":"A Rate Distortion Method for Waveform Design in RF Image Formation","author":"bonneau","year":"0","journal-title":"Applied Imagery and Pattern Recognition Workshop October 2005 Washington D C"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/WDD.2010.5592616"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/78.554317"},{"key":"7","article-title":"Detection and estimation with compressive measurements","author":"davenport","year":"2006","journal-title":"Rice ECE Department Technical Report TREE 0610"},{"journal-title":"Diffusion wavelets","year":"2006","author":"coifman","key":"6"},{"key":"5","article-title":"Geometric diffusions as a tool for harmonic analysis and structure definition of data: Diffusion maps","volume":"102","author":"coifman","year":"2005","journal-title":"PNAS"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.862083"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/83.552077"},{"journal-title":"Minmax Estimation Via Wavelet Shrinkage","year":"1991","author":"donoho","key":"8"}],"event":{"name":"2011 IEEE Applied Imagery Pattern Recognition Workshop: Imaging for Decision Making (AIPR 2011)","start":{"date-parts":[[2011,10,11]]},"location":"Washington, DC, USA","end":{"date-parts":[[2011,10,13]]}},"container-title":["2011 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171060\/6176336\/06176350.pdf?arnumber=6176350","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T15:22:00Z","timestamp":1490109720000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176350\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,10]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/aipr.2011.6176350","relation":{},"subject":[],"published":{"date-parts":[[2011,10]]}}}