{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T09:56:29Z","timestamp":1730195789256,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/aipr.2014.7041909","type":"proceedings-article","created":{"date-parts":[[2015,2,18]],"date-time":"2015-02-18T00:21:38Z","timestamp":1424218898000},"page":"1-10","source":"Crossref","is-referenced-by-count":1,"title":["Mathematical model and experimental methodology for calibration of a LWIR polarimetric-hyperspectral imager"],"prefix":"10.1109","author":[{"given":"Joel G.","family":"Holder","sequence":"first","affiliation":[]},{"given":"Jacob A.","family":"Martin","sequence":"additional","affiliation":[]},{"given":"Kevin C.","family":"Gross","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"Polarimetric calibration and characterization of the Telops field portable polarimetric-hyperspectral imager in the long wave infrared","author":"holder","year":"2014","journal-title":"Wright Patterson AFB OH Air Force Institute of Technology"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1117\/12.732137"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1117\/12.689487"},{"key":"ref5","article-title":"Mueller matrices","volume":"2","author":"chipman","year":"1995","journal-title":"Handbook of Optics"},{"key":"ref8","article-title":"Calibration methodoogy and performance characterization of a polarimetric hypserspectral imager","author":"holder","year":"2014","journal-title":"SPIE 9099 Polarization Measurement Analysis and Remote Sensing XI 90990J"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1117\/3.899758.ch8"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1364\/AO.42.001779"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1364\/AO.27.003210"}],"event":{"name":"2014 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)","start":{"date-parts":[[2014,10,14]]},"location":"Washington, DC, USA","end":{"date-parts":[[2014,10,16]]}},"container-title":["2014 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7029842\/7041894\/07041909.pdf?arnumber=7041909","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T18:46:07Z","timestamp":1490381167000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7041909\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/aipr.2014.7041909","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}