{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T15:02:45Z","timestamp":1776956565135,"version":"3.51.4"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/aipr.2017.8457946","type":"proceedings-article","created":{"date-parts":[[2018,9,21]],"date-time":"2018-09-21T20:57:51Z","timestamp":1537563471000},"page":"6403-6408","source":"Crossref","is-referenced-by-count":13,"title":["Roof Damage Assessment using Deep Learning"],"prefix":"10.1109","author":[{"given":"Mahshad Mahdavi","family":"Hezaveh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christopher","family":"Kanan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Carl","family":"Salvaggio","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","year":"0","journal-title":"The Insurance Institute for Business and Home Safety Research Center"},{"key":"ref11","author":"iandola","year":"2014","journal-title":"DenseNet implementing efficient convnet descriptor pyramids"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1201\/b14052-6"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2016.2542358"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2645610"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.5565\/rev\/elcvia.268"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.isprsjprs.2013.06.011"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2009.191"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/3632943"},{"key":"ref8","author":"simonyan","year":"2014","journal-title":"Very Deep Convolutional Networks for Large-scale Image Recognition"},{"key":"ref7","article-title":"Deep residual learning for image recognition","author":"kaiming","year":"2016","journal-title":"Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1117\/1.JRS.10.025021"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.1930.896476"},{"key":"ref9","author":"chatfield","year":"2014","journal-title":"Return of the devil in the details Delving deep into convolutional nets"}],"event":{"name":"2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)","location":"Washington, DC, USA","start":{"date-parts":[[2017,10,10]]},"end":{"date-parts":[[2017,10,12]]}},"container-title":["2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8424301\/8457934\/08457946.pdf?arnumber=8457946","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T00:23:02Z","timestamp":1598228582000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8457946\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/aipr.2017.8457946","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}