{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,5]],"date-time":"2025-12-05T12:31:57Z","timestamp":1764937917191,"version":"build-2065373602"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,9,24]],"date-time":"2025-09-24T00:00:00Z","timestamp":1758672000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,24]],"date-time":"2025-09-24T00:00:00Z","timestamp":1758672000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100018693","name":"Horizon Europe","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100018693","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100014013","name":"UK Research and Innovation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100014013","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,9,24]]},"DOI":"10.1109\/amps66841.2025.11219960","type":"proceedings-article","created":{"date-parts":[[2025,11,3]],"date-time":"2025-11-03T18:42:54Z","timestamp":1762195374000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["On the Definition of Power Grid Representative Test Waveforms for Sample-by-Sample Uncertainty Analysis"],"prefix":"10.1109","author":[{"given":"Alexander","family":"Gallarreta","sequence":"first","affiliation":[{"name":"University of the Basque Country (UPV\/EHU),Spain"}]},{"given":"Heiko","family":"F\u00fcser","sequence":"additional","affiliation":[{"name":"Physikalisch-Technische Bundesanstalt (PTB),Germany"}]},{"given":"Yljon","family":"Seferi","sequence":"additional","affiliation":[{"name":"University of Strathclyde,United Kingdom"}]},{"given":"Tezg\u00fcl C.","family":"\u00d6zt\u00fcrk","sequence":"additional","affiliation":[{"name":"TÜBİTAK Ulusal Metroloji Enstitüsü (UME),Turkey"}]},{"given":"David","family":"De La Vega","sequence":"additional","affiliation":[{"name":"University of the Basque Country (UPV\/EHU),Spain"}]},{"given":"Brian G.","family":"Stewart","sequence":"additional","affiliation":[{"name":"University of Strathclyde,United Kingdom"}]},{"given":"Graeme","family":"Burt","sequence":"additional","affiliation":[{"name":"University of Strathclyde,United Kingdom"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tsg.2016.2596788"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2021.3057350"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2015.2504845"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2014.2387483"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2010.2041371"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s40866-024-00195-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.04.032"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.106911"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2018.10.006"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/amps55790.2022.9978743"},{"journal-title":"Transitions, pulses and related waveforms-terms, definitions and algorithms","first-page":"1","year":"2013","key":"ref11"},{"journal-title":"Computation of waveform parameter uncertainties","first-page":"1","year":"2017","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8091044"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/amps.2019.8897794"},{"volume-title":"Support for standardization of sample-by-sample waveform uncertainty computation","key":"ref15"}],"event":{"name":"2025 IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS)","start":{"date-parts":[[2025,9,24]]},"location":"Bucharest, Romania","end":{"date-parts":[[2025,9,26]]}},"container-title":["2025 IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11219883\/11219907\/11219960.pdf?arnumber=11219960","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T06:02:57Z","timestamp":1762236177000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11219960\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,24]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/amps66841.2025.11219960","relation":{},"subject":[],"published":{"date-parts":[[2025,9,24]]}}}