{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T05:49:55Z","timestamp":1725601795583},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,11]]},"DOI":"10.1109\/apccas.2008.4746087","type":"proceedings-article","created":{"date-parts":[[2009,1,16]],"date-time":"2009-01-16T15:24:53Z","timestamp":1232119493000},"page":"570-573","source":"Crossref","is-referenced-by-count":2,"title":["A novel leakage-estimation method for input-vector control"],"prefix":"10.1109","author":[{"given":"Hans-Peter","family":"Keil","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Massoud","family":"Momeni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andre","family":"Guntoro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alberto","family":"Garcia Ortiz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manfred","family":"Glesner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","article-title":"simultaneous subthreshold and gate-oxide tunneling leakage current analysis in nanometer cmos design","author":"lee","year":"2003","journal-title":"Proc Int Symp Quality Electronic Design (ISQED)"},{"key":"2","article-title":"evaluating runtime techniques for leakage power reduction","author":"duarte","year":"2002","journal-title":"IEEE Trans VLSI Syst"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/JPROC.2002.808156"},{"year":"2005","journal-title":"BSIM4 Manual","key":"7"},{"year":"0","key":"6"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/LPE.2001.945400"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/TVLSI.2003.816145"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/TVLSI.2003.821549"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1145\/566421.566425"}],"event":{"name":"APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","start":{"date-parts":[[2008,11,30]]},"location":"Macao, China","end":{"date-parts":[[2008,12,3]]}},"container-title":["APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4723905\/4745943\/04746087.pdf?arnumber=4746087","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T15:19:01Z","timestamp":1489763941000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4746087\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,11]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/apccas.2008.4746087","relation":{},"subject":[],"published":{"date-parts":[[2008,11]]}}}