{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:28:28Z","timestamp":1747805308162},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,12]]},"DOI":"10.1109\/apccas.2010.5774755","type":"proceedings-article","created":{"date-parts":[[2011,5,27]],"date-time":"2011-05-27T13:30:45Z","timestamp":1306503045000},"page":"44-47","source":"Crossref","is-referenced-by-count":14,"title":["ADC linearity test signal generation algorithm"],"prefix":"10.1109","author":[{"given":"Satoshi","family":"Uemori","sequence":"first","affiliation":[]},{"given":"Takahiro J.","family":"Yamaguchi","sequence":"additional","affiliation":[]},{"given":"Satoshi","family":"Ito","sequence":"additional","affiliation":[]},{"given":"Yohei","family":"Tan","sequence":"additional","affiliation":[]},{"given":"Haruo","family":"Kobayashi","sequence":"additional","affiliation":[]},{"given":"Nobukazu","family":"Takai","sequence":"additional","affiliation":[]},{"given":"Kiichi","family":"Niitsu","sequence":"additional","affiliation":[]},{"given":"Nobuyoshi","family":"Ishikawa","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355722"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583979"},{"article-title":"Data Converters","year":"2007","author":"maloberti","key":"ref6"},{"key":"ref5","article-title":"A Fully Digital-Compatible BIST Strategy for ADC Linearity Testing","author":"xing","year":"2007","journal-title":"IEEE International Test Conference"},{"key":"ref8","article-title":"Test Signal Generation Algorithm for ADC in SOC","author":"uemori","year":"2010","journal-title":"ICE Annual Conference"},{"article-title":"Genetic Algorithms: The Design of Innovation","year":"2010","author":"goldberg","key":"ref7"},{"article-title":"Demystifying Mixed-Signal Test Methods","year":"2003","author":"baker","key":"ref2"},{"article-title":"An Introduction to Mixed-Signal IC Test and Measurement","year":"2001","author":"burns","key":"ref1"}],"event":{"name":"APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems","start":{"date-parts":[[2010,12,6]]},"location":"Kuala Lumpur, Malaysia","end":{"date-parts":[[2010,12,9]]}},"container-title":["2010 IEEE Asia Pacific Conference on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5767825\/5774732\/05774755.pdf?arnumber=5774755","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T05:06:06Z","timestamp":1490072766000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5774755\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,12]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/apccas.2010.5774755","relation":{},"subject":[],"published":{"date-parts":[[2010,12]]}}}