{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:01:25Z","timestamp":1761580885255,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,12]]},"DOI":"10.1109\/apccas.2010.5774884","type":"proceedings-article","created":{"date-parts":[[2011,5,27]],"date-time":"2011-05-27T17:30:45Z","timestamp":1306517445000},"page":"1007-1010","source":"Crossref","is-referenced-by-count":2,"title":["ADC clock jitter measurement and correction using a stochastic TDC"],"prefix":"10.1109","author":[{"given":"Chi-Wei","family":"Fan","sequence":"first","affiliation":[]},{"given":"Jieh-Tsorng","family":"Wu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2021209"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2008.79"},{"year":"0","key":"ref6","article-title":"AD9446 Datasheet"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2005.1494094"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2010109"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2000.852849"},{"key":"ref2","first-page":"880","article-title":"Aperture jitter effects in wideband sampling systems","volume":"2","author":"kobayashi","year":"1999","journal-title":"Proc Instrumentation and Measurement Technology Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2002.1007092"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/4.50307"}],"event":{"name":"APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems","start":{"date-parts":[[2010,12,6]]},"location":"Kuala Lumpur, Malaysia","end":{"date-parts":[[2010,12,9]]}},"container-title":["2010 IEEE Asia Pacific Conference on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5767825\/5774732\/05774884.pdf?arnumber=5774884","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T09:25:46Z","timestamp":1490088346000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5774884\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,12]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/apccas.2010.5774884","relation":{},"subject":[],"published":{"date-parts":[[2010,12]]}}}