{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T13:38:20Z","timestamp":1725457100429},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,12]]},"DOI":"10.1109\/apccas.2010.5774897","type":"proceedings-article","created":{"date-parts":[[2011,5,27]],"date-time":"2011-05-27T13:30:45Z","timestamp":1306503045000},"page":"256-259","source":"Crossref","is-referenced-by-count":2,"title":["Testing techniques for resistive-open defects in future CMOS technologies"],"prefix":"10.1109","author":[{"given":"Mohammad","family":"Fawaz","sequence":"first","affiliation":[]},{"given":"Nader","family":"Kobrosli","sequence":"additional","affiliation":[]},{"given":"Ali","family":"Chehab","sequence":"additional","affiliation":[]},{"given":"Ayman","family":"Kayssi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits","author":"chehab","year":"2002","journal-title":"1st International Workshop on Electronic Design Test & Applications (DELTA 2000)"},{"key":"ref11","first-page":"11","article-title":"An Improved Method for iDDT Testing in the Presence of Leakage and Process Variation","author":"chehab","year":"2004","journal-title":"Proc IEEE Int Workshop Current Defect Based Testing (DBT 04)"},{"key":"ref12","first-page":"58","article-title":"Evaluation of iDDT Testing for CMOS Domino Circuits","author":"nazer","year":"2005","journal-title":"Proc IEEE International Workshop on Defect Based Testing (DBT 2005)"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/IDT.2007.4437433"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1145\/1229175.1229176"},{"year":"0","journal-title":"Predictive Technology Model","key":"ref15"},{"key":"ref16","first-page":"396","article-title":"Characterizing Process Variation in Nanometer CMOS","author":"agarwal","year":"2007","journal-title":"Design Automation Conference"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/MM.2005.110"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TED.2006.880165"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/IEDM.2007.4418976"},{"key":"ref4","first-page":"49","article-title":"Current Testing for nanotechnologies: A Demystifying Application Perspective","author":"manhaeve","year":"2005","journal-title":"IEEE DBT 2005"},{"key":"ref3","first-page":"724","article-title":"IDDQ Testing in Deep Submicron Integrated Circuits","author":"miller","year":"1999","journal-title":"Int Test Conf"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1007\/s10836-006-9318-8"},{"key":"ref5","first-page":"47","article-title":"Transient Current Testing of 0.25 mm CMOS Devices","author":"kruseman","year":"1999","journal-title":"Int Test Conf"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ASEMD.2009.5306676"},{"key":"ref7","first-page":"57","article-title":"Statistical Threshold Formulation For Dynamic Idd Test","author":"jiang","year":"1999","journal-title":"Int Test Conf"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TEST.1999.805800"},{"year":"2009","journal-title":"International Technology Roadmap for Semiconductors","key":"ref1"},{"key":"ref9","article-title":"IDDT Testing: An Efficient Method for Detecting Delay Faults and Open Defects","author":"ishida","year":"2001","journal-title":"Proc IEEE Int l Workshop on Defect Based Testing"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/CICC.2001.929760"}],"event":{"name":"APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems","start":{"date-parts":[[2010,12,6]]},"location":"Kuala Lumpur, Malaysia","end":{"date-parts":[[2010,12,9]]}},"container-title":["2010 IEEE Asia Pacific Conference on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5767825\/5774732\/05774897.pdf?arnumber=5774897","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T05:18:03Z","timestamp":1490073483000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5774897\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,12]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/apccas.2010.5774897","relation":{},"subject":[],"published":{"date-parts":[[2010,12]]}}}