{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T13:41:39Z","timestamp":1760708499293},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,12]]},"DOI":"10.1109\/apccas.2012.6419049","type":"proceedings-article","created":{"date-parts":[[2013,1,30]],"date-time":"2013-01-30T17:53:42Z","timestamp":1359568422000},"page":"372-375","source":"Crossref","is-referenced-by-count":1,"title":["A design for testability of non-volatile memory reliability test for automotive embedded processor"],"prefix":"10.1109","author":[{"given":"Chung","family":"Chuang","sequence":"first","affiliation":[]},{"given":"Chun-Yen","family":"Wu","sequence":"additional","affiliation":[]},{"given":"Chi-Chun","family":"Hsu","sequence":"additional","affiliation":[]},{"given":"Li-Ren","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Wei-Min","family":"Cheng","sequence":"additional","affiliation":[]},{"given":"Wen-Dar","family":"Hsieh","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Non-volatile Memory Program\/erase Endurance data Retention and Operating Life Test","year":"2004","key":"3"},{"journal-title":"Failure Machanism Based Stress Test Qalification for Integrated Circuit","year":"2007","key":"2"},{"year":"0","key":"1"},{"year":"0","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/NVMT.2008.4731197"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.15"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1198687"}],"event":{"name":"APCCAS 2012-2012 IEEE Asia Pacific Conference on Circuits and Systems","start":{"date-parts":[[2012,12,2]]},"location":"Kaohsiung, Taiwan","end":{"date-parts":[[2012,12,5]]}},"container-title":["2012 IEEE Asia Pacific Conference on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6412846\/6418954\/06419049.pdf?arnumber=6419049","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T16:15:06Z","timestamp":1490112906000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6419049\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,12]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/apccas.2012.6419049","relation":{},"subject":[],"published":{"date-parts":[[2012,12]]}}}