{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T19:39:13Z","timestamp":1725478753948},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,12]]},"DOI":"10.1109\/apccas.2012.6419072","type":"proceedings-article","created":{"date-parts":[[2013,1,30]],"date-time":"2013-01-30T22:53:42Z","timestamp":1359586422000},"page":"463-466","source":"Crossref","is-referenced-by-count":1,"title":["A comprehensive comparative analysis of FinFET and Trigate device, SRAM and logic circuits"],"prefix":"10.1109","author":[{"given":"Chia-Hao","family":"Pao","sequence":"first","affiliation":[]},{"given":"Ming-Long","family":"Fan","sequence":"additional","affiliation":[]},{"given":"Ming-Fu","family":"Tsai","sequence":"additional","affiliation":[]},{"given":"Yin-Nien","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Vita Pi-Ho","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Pin","family":"Su","sequence":"additional","affiliation":[]},{"given":"Ching-Te","family":"Chuang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"crossref","first-page":"90","DOI":"10.1109\/55.46938","article-title":"Random telegraph noise of deep-submicrometer mosfet's","author":"hung","year":"1990","journal-title":"IEEE EDL"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2096225"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.909206"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2200686"},{"key":"13","first-page":"18","article-title":"Critical discussion on (100) and (110) orientation dependent transport: NMOS planar and FinFET","author":"young","year":"2011","journal-title":"IEEE VLSI Des"},{"journal-title":"Sentaurus TCAD C2009-06 Manual","year":"2009","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.813457"},{"key":"12","article-title":"Investigation and comparison of work function variation for finfet and ultra-thin-body soi devices using a voronoi approach","author":"chao","year":"2012","journal-title":"SSDM"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.902166"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2008.917838"},{"year":"0","key":"1"},{"key":"10","first-page":"541","article-title":"Impact of threshold voltage fluctuation due to random telegraph noise on scaled-down SRAM","author":"tega","year":"2008","journal-title":"IEEE IRPS"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2006.880640"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2069080"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2063270"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796707"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1063\/1.366892"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.811418"}],"event":{"name":"APCCAS 2012-2012 IEEE Asia Pacific Conference on Circuits and Systems","start":{"date-parts":[[2012,12,2]]},"location":"Kaohsiung, Taiwan","end":{"date-parts":[[2012,12,5]]}},"container-title":["2012 IEEE Asia Pacific Conference on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6412846\/6418954\/06419072.pdf?arnumber=6419072","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T06:42:49Z","timestamp":1498027369000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6419072\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,12]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/apccas.2012.6419072","relation":{},"subject":[],"published":{"date-parts":[[2012,12]]}}}