{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T15:51:12Z","timestamp":1729612272488,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/apccas.2016.7803881","type":"proceedings-article","created":{"date-parts":[[2017,1,11]],"date-time":"2017-01-11T16:22:50Z","timestamp":1484151770000},"page":"5-8","source":"Crossref","is-referenced-by-count":3,"title":["Optimized three scores combination for image quality assessment"],"prefix":"10.1109","author":[{"given":"Kei","family":"Ishiyama","sequence":"first","affiliation":[]},{"given":"Yosuke","family":"Sugiura","sequence":"additional","affiliation":[]},{"given":"Tetsuya","family":"Shimamura","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2169971"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.901820"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2006.881959"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2013.6719032"},{"key":"ref8","first-page":"30","article-title":"TID2008 - A database for evaluation of full-reference visual quality assessment metrics","volume":"10","author":"ponomarenko","year":"2009","journal-title":"Advances of Modern Radioelectronics"},{"journal-title":"Practical Genetic Algorithms","year":"1998","author":"haupt","key":"ref7"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"1398","DOI":"10.1109\/ACSSC.2003.1292216","article-title":"Multi-scale structural similarity for image quality assessment","volume":"2","author":"wang","year":"2003","journal-title":"Proc Asilomar Conf Signals Systems and Computers"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"}],"event":{"name":"2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","start":{"date-parts":[[2016,10,25]]},"location":"Jeju, South Korea","end":{"date-parts":[[2016,10,28]]}},"container-title":["2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7786273\/7803879\/07803881.pdf?arnumber=7803881","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,17]],"date-time":"2019-09-17T08:07:31Z","timestamp":1568707651000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7803881\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/apccas.2016.7803881","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}