{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T04:42:39Z","timestamp":1725597759796},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/apccas.2016.7804004","type":"proceedings-article","created":{"date-parts":[[2017,1,11]],"date-time":"2017-01-11T21:22:50Z","timestamp":1484169770000},"page":"465-468","source":"Crossref","is-referenced-by-count":0,"title":["A post-processing algorithm for reducing strong error effects in NAND flash memory"],"prefix":"10.1109","author":[{"given":"Sung-Rae","family":"Kim","sequence":"first","affiliation":[]},{"given":"Kijun","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Gyuyeol","family":"Kong","sequence":"additional","affiliation":[]},{"given":"Myung-Kyu","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Dongmin","family":"Shin","sequence":"additional","affiliation":[]},{"given":"Geunyeong","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Beomkyu","family":"Shin","sequence":"additional","affiliation":[]},{"given":"Pilsang","family":"Yoon","sequence":"additional","affiliation":[]},{"given":"Hongrak","family":"Son","sequence":"additional","affiliation":[]},{"given":"Jun-Jin","family":"Kong","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2071990"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/18.910577"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2013.090513.120443"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2014.140509"},{"journal-title":"Introduction to Probability","year":"2008","author":"bertsekas","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2013.090513.120444"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.7551\/mitpress\/4347.001.0001","author":"gallager","year":"1963","journal-title":"Low Density Parity-Check Codes"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.851753"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2046966"}],"event":{"name":"2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","start":{"date-parts":[[2016,10,25]]},"location":"Jeju, South Korea","end":{"date-parts":[[2016,10,28]]}},"container-title":["2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7786273\/7803879\/07804004.pdf?arnumber=7804004","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,21]],"date-time":"2022-07-21T10:01:23Z","timestamp":1658397683000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7804004\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/apccas.2016.7804004","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}