{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,17]],"date-time":"2026-02-17T03:11:07Z","timestamp":1771297867614,"version":"3.50.1"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/apccas.2016.7804028","type":"proceedings-article","created":{"date-parts":[[2017,1,11]],"date-time":"2017-01-11T21:22:50Z","timestamp":1484169770000},"page":"554-556","source":"Crossref","is-referenced-by-count":10,"title":["Low-power counter for column-parallel CMOS image sensors"],"prefix":"10.1109","author":[{"given":"Jong-Seok","family":"Kim","sequence":"first","affiliation":[]},{"given":"Jin-O","family":"Yoon","sequence":"additional","affiliation":[]},{"given":"Byong-Deok","family":"Choi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"396","article-title":"A 1.1 e-temporal noise 1\/3.2-inch 8Mpixel CMOS image sensor using pseudo-multiple sampling","author":"lim","year":"2010","journal-title":"IEEE ISSCC Dig Tech"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.884868"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487825"},{"key":"ref5","first-page":"420","article-title":"A 17.7 Mpixel 120fps CMOS image sensor with 34.8 Gb\/s readout","author":"toyama","year":"2011","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref8","article-title":"Double data rate (DDR) counter, analog-to-digital converter (ADC) using the same, CMOS image sensor using the same and methods in DDR counter, ADC and CMOS image sensor","author":"lim","year":"2011"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.5573\/JSTS.2012.12.4.388"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696261"},{"key":"ref1","first-page":"304","article-title":"An integrated 800×600 CMOS imaging system","author":"yang","year":"1999","journal-title":"IEEE ISSCC Dig Tech Papers"}],"event":{"name":"2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","location":"Jeju, South Korea","start":{"date-parts":[[2016,10,25]]},"end":{"date-parts":[[2016,10,28]]}},"container-title":["2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7786273\/7803879\/07804028.pdf?arnumber=7804028","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,11]],"date-time":"2017-01-11T21:47:37Z","timestamp":1484171257000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7804028\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/apccas.2016.7804028","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}