{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:35:28Z","timestamp":1740101728811,"version":"3.37.3"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T00:00:00Z","timestamp":1668124800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T00:00:00Z","timestamp":1668124800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China (NSFC)","doi-asserted-by":"publisher","award":["62204045,61934002"],"award-info":[{"award-number":["62204045,61934002"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,11,11]]},"DOI":"10.1109\/apccas55924.2022.10090258","type":"proceedings-article","created":{"date-parts":[[2023,4,11]],"date-time":"2023-04-11T17:25:39Z","timestamp":1681233939000},"page":"481-484","source":"Crossref","is-referenced-by-count":0,"title":["An Improved Multi-Objective Optimization Framework for Soft-Error Immune Circuits"],"prefix":"10.1109","author":[{"given":"Shaohang","family":"Chu","sequence":"first","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yan","family":"Li","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xu","family":"Cheng","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoyang","family":"Zeng","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558869"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614526"},{"issue":"9","key":"ref3","first-page":"1619","article-title":"A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28 nm CMOS for Spaceborne Application","volume":"67","author":"Li","year":"2020","journal-title":"TCAS-II"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3076185"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS47380.2019.9745725"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218696"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.1989.100747"},{"key":"ref8","first-page":"785","article-title":"Design as You See FIT: Systemlevel Soft Error Analysis of Sequential Circuits","author":"Holcomb","year":"2009","journal-title":"DATE"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICECCE49384.2020.9179199"}],"event":{"name":"2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","start":{"date-parts":[[2022,11,11]]},"location":"Shenzhen, China","end":{"date-parts":[[2022,11,13]]}},"container-title":["2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10090225\/10090247\/10090258.pdf?arnumber=10090258","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T07:23:04Z","timestamp":1710400984000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10090258\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11,11]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/apccas55924.2022.10090258","relation":{},"subject":[],"published":{"date-parts":[[2022,11,11]]}}}