{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,24]],"date-time":"2026-01-24T14:30:14Z","timestamp":1769265014878,"version":"3.49.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T00:00:00Z","timestamp":1668124800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T00:00:00Z","timestamp":1668124800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,11,11]]},"DOI":"10.1109\/apccas55924.2022.10090398","type":"proceedings-article","created":{"date-parts":[[2023,4,11]],"date-time":"2023-04-11T13:25:39Z","timestamp":1681219539000},"page":"355-359","source":"Crossref","is-referenced-by-count":5,"title":["A Reconfigurable Active-RC Filter with Variable Gain and An RC-Reused Tuning Circuit"],"prefix":"10.1109","author":[{"given":"Shan","family":"Gao","sequence":"first","affiliation":[{"name":"School of Microelectronics, South China University of Technology,Guangzhou,China"}]},{"given":"Zhi-Jian","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Microelectronics, South China University of Technology,Guangzhou,China"}]},{"given":"Xiangfeng","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Microelectronics, South China University of Technology,Guangzhou,China"}]},{"given":"Siyuan","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, South China University of Technology,Guangzhou,China"}]},{"given":"Bin","family":"Li","sequence":"additional","affiliation":[{"name":"School of Microelectronics, South China University of Technology,Guangzhou,China"}]},{"given":"Xiao-Ling","family":"Lin","sequence":"additional","affiliation":[{"name":"Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory,Guangzhou,China"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2693240"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2658635"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2368975"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/4.90039"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2012.6271446"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401674"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2018.2822859"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2008.4542449"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2005.1568750"}],"event":{"name":"2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","location":"Shenzhen, China","start":{"date-parts":[[2022,11,11]]},"end":{"date-parts":[[2022,11,13]]}},"container-title":["2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10090225\/10090247\/10090398.pdf?arnumber=10090398","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,8]],"date-time":"2023-05-08T14:01:36Z","timestamp":1683554496000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10090398\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11,11]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/apccas55924.2022.10090398","relation":{},"subject":[],"published":{"date-parts":[[2022,11,11]]}}}