{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,16]],"date-time":"2026-06-16T05:22:04Z","timestamp":1781587324574,"version":"3.54.5"},"reference-count":2,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,7]],"date-time":"2024-11-07T00:00:00Z","timestamp":1730937600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,7]],"date-time":"2024-11-07T00:00:00Z","timestamp":1730937600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,7]]},"DOI":"10.1109\/apccas62602.2024.10808976","type":"proceedings-article","created":{"date-parts":[[2024,12,27]],"date-time":"2024-12-27T19:09:25Z","timestamp":1735326565000},"page":"1-1","source":"Crossref","is-referenced-by-count":3,"title":["NoC AI Chip Integration for Industrial IoT Fault Diagnosis and Notification System"],"prefix":"10.1109","author":[{"given":"Hus-Chi","family":"Chen","sequence":"first","affiliation":[{"name":"Institute of Electronics National Yang Ming Chiao Tung University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pin-Ching","family":"Shen","sequence":"additional","affiliation":[{"name":"Institute of Electronics National Yang Ming Chiao Tung University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yen-Chen","family":"Yen","sequence":"additional","affiliation":[{"name":"Institute of Electronics National Yang Ming Chiao Tung University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ying-Yu","family":"Wang","sequence":"additional","affiliation":[{"name":"Institute of Electronics National Yang Ming Chiao Tung University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kun-Chih Jimmy","family":"Chen","sequence":"additional","affiliation":[{"name":"Institute of Electronics National Yang Ming Chiao Tung University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s12599-014-0334-4"},{"key":"ref2","article-title":"Downtime in Manufacturing: What\u2019s the True Cost?","author":"Brand","year":"2020","journal-title":"ODEN Technology"}],"event":{"name":"2024 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","location":"Taipei, Taiwan","start":{"date-parts":[[2024,11,7]]},"end":{"date-parts":[[2024,11,9]]}},"container-title":["2024 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10808178\/10808208\/10808976.pdf?arnumber=10808976","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,28]],"date-time":"2024-12-28T06:29:03Z","timestamp":1735367343000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10808976\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,7]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/apccas62602.2024.10808976","relation":{},"subject":[],"published":{"date-parts":[[2024,11,7]]}}}