{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T14:46:47Z","timestamp":1725547607068},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/aqtr.2016.7501287","type":"proceedings-article","created":{"date-parts":[[2016,7,26]],"date-time":"2016-07-26T15:01:06Z","timestamp":1469545266000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Multiple control fault testing in digital systems with high-level decision diagrams"],"prefix":"10.1109","author":[{"given":"Raimund","family":"Ubar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephen Adeboye","family":"Oyeniran","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219064"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/54.485782"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.2298\/FUEE1103303U"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-60960-212-3.ch004"},{"key":"ref14","article-title":"Multiple Fault Testing in SoC with HLDDs","author":"ubar","year":"2015","journal-title":"10th IEEE International Design & Test Symposium IDT'15"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3176\/proc.2014.1.08"},{"key":"ref16","article-title":"New Fault Models and Self-Test Generation for Microprocessors using HLDDs","author":"jasnetski","year":"2015","journal-title":"DDECS"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675602"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569601"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1993.580093"},{"journal-title":"Efficient Techniques for Multiple Fault Test Generation","year":"1994","author":"kajihara","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RFTS.1991.212943"},{"key":"ref8","first-page":"418","article-title":"Complete Test Pattern Generation for Comb. Networks","author":"ubar","year":"1982","journal-title":"Proc Estonian Acad of Sciences Engineering"},{"key":"ref7","first-page":"31","article-title":"Testing of Missing of Faults on the Node of Comb. Circuit","author":"kogan","year":"1976","journal-title":"Avtomatika I Vychislitelnaja Tehnika Automation and Computer Engineering"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.3952"},{"key":"ref1","first-page":"113","article-title":"Testing of Multiple Faults in Comb Circuits","author":"birger","year":"1975","journal-title":"Avtomatika i telemehanika"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2012.6261243"}],"event":{"name":"2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)","start":{"date-parts":[[2016,5,19]]},"location":"Cluj-Napoca, Romania","end":{"date-parts":[[2016,5,21]]}},"container-title":["2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7497413\/7501259\/07501287.pdf?arnumber=7501287","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,10,13]],"date-time":"2016-10-13T11:44:50Z","timestamp":1476359090000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7501287\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/aqtr.2016.7501287","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}