{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T10:37:44Z","timestamp":1730198264489,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/aqtr.2018.8402793","type":"proceedings-article","created":{"date-parts":[[2018,7,30]],"date-time":"2018-07-30T18:05:57Z","timestamp":1532973957000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Trojan circuits masking and debugging of combinational circuits with LUT insertion"],"prefix":"10.1109","author":[{"given":"A.","family":"Matrosova","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Ostanin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11182-014-0313-8"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2014.7027067"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/AQTR.2016.7501284"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11182-016-0903-8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2015.64"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1007\/978-3-642-14295-6_5","article-title":"ABC: An Academic Industrial-Strength Verification Tool","volume":"6174","author":"brayton","year":"2010","journal-title":"Computer Aided Verification"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.55"},{"key":"ref7","first-page":"695","author":"mangassarian","year":"2012","journal-title":"On error tolerance and Engineering Change with Partially Programmable Circuits"},{"key":"ref2","first-page":"237","article-title":"Increasing yield using partially-programmable circuits","author":"yamashita","year":"2010","journal-title":"Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2007.19"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/BEC.2014.7320562"}],"event":{"name":"2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)","start":{"date-parts":[[2018,5,24]]},"location":"Cluj-Napoca, Romania","end":{"date-parts":[[2018,5,26]]}},"container-title":["2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8398195\/8402681\/08402793.pdf?arnumber=8402793","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T06:17:52Z","timestamp":1598249872000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8402793\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/aqtr.2018.8402793","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}