{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,26]],"date-time":"2025-07-26T09:18:34Z","timestamp":1753521514440,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T00:00:00Z","timestamp":1652918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T00:00:00Z","timestamp":1652918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,19]]},"DOI":"10.1109\/aqtr55203.2022.9802021","type":"proceedings-article","created":{"date-parts":[[2022,6,23]],"date-time":"2022-06-23T15:38:13Z","timestamp":1655998693000},"page":"1-5","source":"Crossref","is-referenced-by-count":5,"title":["PCB Quality Check: Optical Inspection Using Color Mask and Thresholding"],"prefix":"10.1109","author":[{"given":"Emilia","family":"Sipos","sequence":"first","affiliation":[{"name":"Technical University of Cluj-Napoca,Bases of Electronics Department,Cluj-Napoca,Romania"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexandra","family":"Ones","sequence":"additional","affiliation":[{"name":"Technical University of Cluj-Napoca,Bases of Electronics Department,Cluj-Napoca,Romania"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Laura-Nicoleta","family":"Ivanciu","sequence":"additional","affiliation":[{"name":"Technical University of Cluj-Napoca,Bases of Electronics Department,Cluj-Napoca,Romania"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICICCT.2018.8473285"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"28","DOI":"10.5120\/ijca2016909623","article-title":"Quality Control of PCB using Image Processing","volume":"141","author":"rasika","year":"2016","journal-title":"International Journal of Computer Applications"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IDAP.2017.8090292"},{"year":"0","key":"ref10"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICEECCOT.2017.8284602"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MPCIT51588.2020.9350324"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCS45141.2019.9065636"},{"key":"ref2","article-title":"Inspection and testing methods for PCBs: An overview","author":"houdek","year":"2014","journal-title":"Caltronics"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1142\/S0218001420580057"},{"key":"ref1","first-page":"561","article-title":"Deming's 14 points for management: framework for success","volume":"36","author":"neave","year":"1987","journal-title":"Journal of the Royal Statistical Society Series D (The Statistician)"}],"event":{"name":"2022 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)","start":{"date-parts":[[2022,5,19]]},"location":"Cluj-Napoca, Romania","end":{"date-parts":[[2022,5,21]]}},"container-title":["2022 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9801904\/9801909\/09802021.pdf?arnumber=9802021","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T16:47:48Z","timestamp":1658162868000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9802021\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,19]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/aqtr55203.2022.9802021","relation":{},"subject":[],"published":{"date-parts":[[2022,5,19]]}}}