{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,15]],"date-time":"2024-09-15T18:30:06Z","timestamp":1726425006551},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,6]]},"DOI":"10.1109\/ascc.2013.6606378","type":"proceedings-article","created":{"date-parts":[[2013,9,27]],"date-time":"2013-09-27T20:08:02Z","timestamp":1380312482000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Developing a spiral scanning method using atomic force microscopy"],"prefix":"10.1109","author":[{"family":"Habibullah","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H. R.","family":"Pota","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I. R.","family":"Petersen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/11\/1\/301"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1063\/1.1145552"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2010.937676"},{"journal-title":"Control System Design An Introduction to State Space Methods","year":"1986","author":"friedland","key":"15"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1007\/s11767-011-0423-1"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1983.1103141"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1115\/1.1467653"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ICARCV.2012.6485174"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1007\/BF01211648"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.56.930"},{"journal-title":"Scanning Probe Microscopes","year":"1995","author":"yves","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3155790"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2009.2036844"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2007.902956"},{"key":"6","first-page":"2258","article-title":"Robust H\ufffd control in fast atomic force microscopy","author":"chuang","year":"2011","journal-title":"Proceedings American Control Conference"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2011.2114347"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-006-0442-5"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2008.2001186"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2007.903345"}],"event":{"name":"2013 9th Asian Control Conference (ASCC)","start":{"date-parts":[[2013,6,23]]},"location":"Istanbul","end":{"date-parts":[[2013,6,26]]}},"container-title":["2013 9th Asian Control Conference (ASCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6589047\/6605987\/06606378.pdf?arnumber=6606378","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,25]],"date-time":"2019-06-25T19:51:36Z","timestamp":1561492296000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6606378\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,6]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/ascc.2013.6606378","relation":{},"subject":[],"published":{"date-parts":[[2013,6]]}}}