{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,8]],"date-time":"2026-03-08T00:07:39Z","timestamp":1772928459233,"version":"3.50.1"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/ase.2017.8115724","type":"proceedings-article","created":{"date-parts":[[2017,11,23]],"date-time":"2017-11-23T17:03:57Z","timestamp":1511456637000},"page":"1022-1025","source":"Crossref","is-referenced-by-count":18,"title":["Towards a software vulnerability prediction model using traceable code patterns and software metrics"],"prefix":"10.1109","author":[{"given":"Kazi Zakia","family":"Sultana","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2010.06.003"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/32.295895"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233837"},{"key":"ref13","first-page":"271","article-title":"Finding security errors in Java programs with static analysis","author":"livshits","year":"2005","journal-title":"Proc of the 14th USENIX Security Symposium"},{"key":"ref14","author":"sheskin","year":"2007","journal-title":"Handbook of Parametric and Nonparametric Statistical Procedures"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.entcs.2010.08.042"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/HASE.2017.18"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1137983.1137995"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1094811.1094819"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SEAA.2012.63"},{"key":"ref7","article-title":"Preliminary Study on Assessing Software Defects Using Nano-Pattern Detection","author":"deo","year":"2015","journal-title":"Proc of the 24th International Conference on Software Engineering and Data Engineering (SEDE)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2016.34"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1900008.1900089"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.81"}],"event":{"name":"2017 32nd IEEE\/ACM International Conference on Automated Software Engineering (ASE)","location":"Urbana, IL","start":{"date-parts":[[2017,10,30]]},"end":{"date-parts":[[2017,11,3]]}},"container-title":["2017 32nd IEEE\/ACM International Conference on Automated Software Engineering (ASE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8106906\/8115603\/08115724.pdf?arnumber=8115724","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,1,8]],"date-time":"2018-01-08T17:47:20Z","timestamp":1515433640000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8115724\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ase.2017.8115724","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}