{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T16:01:46Z","timestamp":1784995306571,"version":"3.55.0"},"reference-count":47,"publisher":"IEEE","license":[{"start":{"date-parts":[[2017,10,1]],"date-time":"2017-10-01T00:00:00Z","timestamp":1506816000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2017,10,1]],"date-time":"2017-10-01T00:00:00Z","timestamp":1506816000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/asianhost.2017.8353988","type":"proceedings-article","created":{"date-parts":[[2018,5,7]],"date-time":"2018-05-07T19:05:05Z","timestamp":1525719905000},"page":"13-18","source":"Crossref","is-referenced-by-count":4,"title":["Implementation of stable PUFs using gate oxide breakdown"],"prefix":"10.1109","author":[{"given":"Wei-Che","family":"Wang","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, University of California, Los Angeles"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yair","family":"Yona","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, University of California, Los Angeles"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yizhang","family":"Wu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, University of California, Los Angeles"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Szu-Yao","family":"Hung","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, University of California, Los Angeles"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Suhas","family":"Diggavi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, University of California, Los Angeles"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Puneet","family":"Gupta","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, University of California, Los Angeles"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1088\/1468-6996\/9\/1\/014111"},{"key":"ref38","article-title":"Electron-Beam-Induced Current Study of Breakdown Behavior of High-K Gate MOSFETs","author":"chen","year":"2010","journal-title":"Solid State Phenomena"},{"key":"ref33","article-title":"Multilevel routing with jumper insertion for antenna avoidance","author":"ho","year":"2004","journal-title":"Proc IEEE International SOC Conference"},{"key":"ref32","article-title":"Optimal Jumper Insertion for Antenna Avoidance Considering Antenna Charge Sharing","author":"wang","year":"2007","journal-title":"IEEE TCAD"},{"key":"ref31","author":"wang","year":"2004","journal-title":"Detection of an protection against charging damage in modern IC technology"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532015"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2287514"},{"key":"ref36","author":"ki kim","year":"0","journal-title":"Reliable CMOS VLSI Design Considering Gate Oxide Breakdown"},{"key":"ref35","article-title":"An attack on puf-based session key exchange and a hardware-based countermeasure: Erasable PUFs","author":"r\u00fchrmair","year":"2011","journal-title":"International Conference on FC"},{"key":"ref34","article-title":"Physical origins of plasma damage and its process\/gate area effects on high-k metal gate technology","author":"liao others","year":"2013","journal-title":"IEEE IRPS"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-14452-3_1"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2010.5560287"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2000.839821"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346548"},{"key":"ref13","article-title":"Physical Unclonable Functions for Device Authentication and Secret Key Generation","author":"suh","year":"2007","journal-title":"Proc DAC"},{"key":"ref14","article-title":"Improving the quality of a Physical Un-clonable Function using configurable Ring Oscillators","author":"maiti","year":"2009","journal-title":"International Conference on FPL"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.3396186"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/4.350196"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2012.2195174"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2014.6783360"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/55.145080"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495548"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/11\/4\/002"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2015.7372589"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2005.1502600"},{"key":"ref5","article-title":"CACI: Dynamic current analysis towards robust recycled chip identification","author":"yu","year":"2014","journal-title":"Proc DAC"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref7","article-title":"ARO-PUF: An aging-resistant ring oscillator PUF design","author":"rahman","year":"2014","journal-title":"Proc DATE"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-23951-9_27"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513105"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/586110.586132"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1201\/b18673"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/WIFS.2010.5711471"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-74735-2_5"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495551"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2354836"},{"key":"ref21","article-title":"Key-recovery attacks on various RO PUF constructions via helper data manipulation","author":"delvaux","year":"2014","journal-title":"Proc DATE"},{"key":"ref42","article-title":"PUFs at a glance","author":"r\u00fchrmair","year":"2014","journal-title":"Proc DATE"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-40349-1_6"},{"key":"ref41","article-title":"A Systematic Method to Evaluate and Compare the Performance of Physical Unclonable Functions","author":"gunreddy","year":"2013","journal-title":"Embedded Systems Design with FPGAs"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495549"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1214\/aop\/1176991519"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/16.661235"},{"key":"ref43","author":"cover","year":"2006","journal-title":"Elements of Information Theory"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/55.830970"}],"event":{"name":"2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)","location":"Beijing, China","start":{"date-parts":[[2017,10,19]]},"end":{"date-parts":[[2017,10,20]]}},"container-title":["2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8352523\/8353984\/08353988.pdf?arnumber=8353988","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,12]],"date-time":"2025-09-12T17:28:45Z","timestamp":1757698125000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353988\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/asianhost.2017.8353988","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}