{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T05:27:58Z","timestamp":1790832478775,"version":"4.1.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/asianhost.2017.8354004","type":"proceedings-article","created":{"date-parts":[[2018,5,7]],"date-time":"2018-05-07T19:05:05Z","timestamp":1525719905000},"page":"109-114","source":"Crossref","is-referenced-by-count":11,"title":["Employing dual-complementary flip-flops to detect EMFI attacks"],"prefix":"10.1109","author":[{"given":"Chinmay","family":"Deshpande","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bilgiday","family":"Yuce","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Leyla","family":"Nazhandali","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Patrick","family":"Schaumont","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","first-page":"1","article-title":"Efficiency of a glitch detector against electromagnetic fault injection","author":"zussa","year":"2014","journal-title":"Design DATE 2014 IEEE"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EDCC-7.2008.11"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2015.9"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2012.21"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"16","DOI":"10.1007\/978-3-540-28632-5_2","article-title":"Correlation Power Analysis with a Leakage Model","author":"brier","year":"2004","journal-title":"Cryptographic Hardware and Embedded Systems-CHES 2004"},{"key":"ref5","first-page":"8","article-title":"Fame: Fault-attack aware microprocessor extensions for hardware fault detection and software fault response","author":"bilgiday","year":"2016","journal-title":"Proceedings of the Hardware and Architectural Support for Security and Privacy 2016"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2017.7918333"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0164"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898065"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2005.862424"},{"key":"ref9","first-page":"245","article-title":"Evidence of a larger em-induced fault model","author":"ordas","year":"2014","journal-title":"International Conference on Smart Card Research and Advanced Applications"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2188769"}],"event":{"name":"2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)","location":"Beijing","start":{"date-parts":[[2017,10,19]]},"end":{"date-parts":[[2017,10,20]]}},"container-title":["2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8352523\/8353984\/08354004.pdf?arnumber=8354004","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,21]],"date-time":"2018-05-21T20:17:45Z","timestamp":1526933865000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8354004\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/asianhost.2017.8354004","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}