{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T10:47:40Z","timestamp":1730198860706,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,10]]},"DOI":"10.1109\/asicon.2011.6157127","type":"proceedings-article","created":{"date-parts":[[2012,2,28]],"date-time":"2012-02-28T20:44:14Z","timestamp":1330461854000},"page":"79-82","source":"Crossref","is-referenced-by-count":0,"title":["Multi-stage power gating based on controlling values of logic gates"],"prefix":"10.1109","author":[{"given":"Yu","family":"Jin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shinji","family":"Kimura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2010.5450407"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378656"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.462.0169"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E92.A.3111"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1093\/ietfec\/e91-a.12.3531"},{"key":"5","first-page":"73","article-title":"Temperature- dependent model for break-even time in fine- grain power gating and adaptive control based on the temperature dependence","volume":"110","author":"usami","year":"2010","journal-title":"IEICE technical report"},{"key":"4","first-page":"155","article-title":"A Design Approach for Fine-grained Run-Time Power Gating using Locally Extracted Sleep Signals","author":"usami","year":"2006","journal-title":"IEEE International Conference on Computer Design (ICCD'06)"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2009.2035268"}],"event":{"name":"2011 IEEE 9th International Conference on ASIC (ASICON 2011)","start":{"date-parts":[[2011,10,25]]},"location":"Xiamen, China","end":{"date-parts":[[2011,10,28]]}},"container-title":["2011 9th IEEE International Conference on ASIC"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6153219\/6157041\/06157127.pdf?arnumber=6157127","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T15:09:26Z","timestamp":1490108966000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6157127\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/asicon.2011.6157127","relation":{},"subject":[],"published":{"date-parts":[[2011,10]]}}}