{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T17:20:01Z","timestamp":1725384001378},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,10]]},"DOI":"10.1109\/asicon.2011.6157166","type":"proceedings-article","created":{"date-parts":[[2012,2,28]],"date-time":"2012-02-28T20:44:14Z","timestamp":1330461854000},"page":"240-243","source":"Crossref","is-referenced-by-count":0,"title":["A new scheme for testability improvement of ECC incorporated memory"],"prefix":"10.1109","author":[{"family":"Lei Wang","sequence":"first","affiliation":[]},{"family":"Jianhua Jiang","sequence":"additional","affiliation":[]},{"family":"Yumei Zhou","sequence":"additional","affiliation":[]},{"family":"Gaofeng Ren","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"104","article-title":"Embedded Memory Reliability: The SER Challenge","author":"vardanian","year":"2004","journal-title":"2004 Ineternational Workshop on Memory Technology Design and Testing"},{"key":"2","first-page":"81","article-title":"An Integrated ECC and Redundancy Repair Scheme for Memory Reliability Enhancement","author":"su","year":"2005","journal-title":"Proceedings of the 2005 20th IEEE International Symposium on Detect and Fault Tolerance in VLSI Systems"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jnca.2010.11.006"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/12.494111"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1002\/047122460X"}],"event":{"name":"2011 IEEE 9th International Conference on ASIC (ASICON 2011)","start":{"date-parts":[[2011,10,25]]},"location":"Xiamen, China","end":{"date-parts":[[2011,10,28]]}},"container-title":["2011 9th IEEE International Conference on ASIC"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6153219\/6157041\/06157166.pdf?arnumber=6157166","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T15:24:26Z","timestamp":1490109866000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6157166\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,10]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/asicon.2011.6157166","relation":{},"subject":[],"published":{"date-parts":[[2011,10]]}}}