{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T00:03:35Z","timestamp":1729641815666,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,10]]},"DOI":"10.1109\/asicon.2011.6157268","type":"proceedings-article","created":{"date-parts":[[2012,2,28]],"date-time":"2012-02-28T20:44:14Z","timestamp":1330461854000},"page":"566-569","source":"Crossref","is-referenced-by-count":0,"title":["An efficient solver for statistical capacitance extraction considering random process variations"],"prefix":"10.1109","author":[{"family":"Rubing Bai","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Shan Zeng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Qingqing Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenjian","family":"Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"1556","DOI":"10.1109\/TVLSI.2009.2025378","volume":"18","author":"shen","year":"2010","journal-title":"IEEE Trans VLSI"},{"key":"2","first-page":"1514","author":"zhu","year":"2007","journal-title":"Design Automation & Test in Europe Conference & Exhibition"},{"year":"2007","journal-title":"The International Technology Roadmap for Semiconductors (ITRS)","key":"10"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/ASPDAC.2011.5722272"},{"year":"0","journal-title":"Numerical Recipes","key":"7"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/43.97624"},{"key":"5","first-page":"758","author":"yu","year":"2009","journal-title":"Design Automation Conference"},{"key":"4","doi-asserted-by":"crossref","first-page":"580","DOI":"10.1145\/1403375.1403517","author":"zhang","year":"2008","journal-title":"Design Automation & Test in Europe Conference & Exhibition"},{"year":"0","author":"cao","journal-title":"Predictive Technology Model","key":"9"},{"year":"0","journal-title":"The OpenMP API specification for parallel programming","key":"8"}],"event":{"name":"2011 IEEE 9th International Conference on ASIC (ASICON 2011)","start":{"date-parts":[[2011,10,25]]},"location":"Xiamen, China","end":{"date-parts":[[2011,10,28]]}},"container-title":["2011 9th IEEE International Conference on ASIC"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6153219\/6157041\/06157268.pdf?arnumber=6157268","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,31]],"date-time":"2021-12-31T20:03:13Z","timestamp":1640980993000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6157268\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,10]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/asicon.2011.6157268","relation":{},"subject":[],"published":{"date-parts":[[2011,10]]}}}