{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:36:41Z","timestamp":1729651001811,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/asicon.2013.6811933","type":"proceedings-article","created":{"date-parts":[[2014,5,16]],"date-time":"2014-05-16T21:51:33Z","timestamp":1400277093000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Compact modeling of the diode reverse recovery effect for leading developments of power electronic applications"],"prefix":"10.1109","author":[{"given":"Masataka","family":"Miyake","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kai","family":"Matsuura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Akifumi","family":"Ueno","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Spice Webpage Within the Department of Electrical Engineering and Computer Science (EECS)","year":"0","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/63.76804"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.880827"},{"year":"0","key":"12"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E95.C.1682"},{"year":"0","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/28.913734"},{"journal-title":"EVTeC","year":"2011","author":"hirose","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2226181"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2226181"},{"key":"5","first-page":"262","author":"matsuura","year":"2013","journal-title":"Int'l Workshop on Computational Electronics"},{"key":"4","doi-asserted-by":"crossref","first-page":"1","DOI":"10.7567\/JJAP.51.02BP06","volume":"51","author":"nakashima","year":"2012","journal-title":"Jpn J Appl Phys"},{"key":"9","first-page":"148","author":"miyake","year":"2011","journal-title":"ISPSD"},{"key":"8","doi-asserted-by":"crossref","first-page":"1103","DOI":"10.4028\/www.scientific.net\/MSF.740-742.1103","volume":"740 742","author":"miyake","year":"2013","journal-title":"Trans Tech Publications Materials Science Forum"}],"event":{"name":"2013 IEEE 10th International Conference on ASIC (ASICON 2013)","start":{"date-parts":[[2013,10,28]]},"location":"Shenzhen, China","end":{"date-parts":[[2013,10,31]]}},"container-title":["2013 IEEE 10th International Conference on ASIC"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6805351\/6811820\/06811933.pdf?arnumber=6811933","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T13:21:49Z","timestamp":1498137709000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6811933\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/asicon.2013.6811933","relation":{},"subject":[],"published":{"date-parts":[[2013,10]]}}}