{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T21:16:39Z","timestamp":1725570999863},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/asicon.2013.6812023","type":"proceedings-article","created":{"date-parts":[[2014,5,16]],"date-time":"2014-05-16T21:51:33Z","timestamp":1400277093000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Design and test of an SRAM chip"],"prefix":"10.1109","author":[{"family":"Wenbin Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jinhui Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ligang Hou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Hongyan Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jianbo Kang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"495","author":"jain","year":"2006","journal-title":"Proceedings of 11th International Conference on VLSI Design"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"2012","key":"2"},{"key":"1","first-page":"650","author":"zhang kevin","year":"2008","journal-title":"Solid-State Circuits Conference"}],"event":{"name":"2013 IEEE 10th International Conference on ASIC (ASICON 2013)","start":{"date-parts":[[2013,10,28]]},"location":"Shenzhen, China","end":{"date-parts":[[2013,10,31]]}},"container-title":["2013 IEEE 10th International Conference on ASIC"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6805351\/6811820\/06812023.pdf?arnumber=6812023","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T15:55:53Z","timestamp":1490284553000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6812023\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/asicon.2013.6812023","relation":{},"subject":[],"published":{"date-parts":[[2013,10]]}}}