{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T19:38:47Z","timestamp":1725478727918},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/asicon.2015.7517038","type":"proceedings-article","created":{"date-parts":[[2016,7,26]],"date-time":"2016-07-26T16:38:31Z","timestamp":1469551111000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Recent progresses of STT memory design and applications"],"prefix":"10.1109","author":[{"given":"Bonan","family":"Yan","sequence":"first","affiliation":[]},{"given":"Yaojun","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Enes","family":"Eken","sequence":"additional","affiliation":[]},{"given":"Wujie","family":"Wen","sequence":"additional","affiliation":[]},{"given":"Weisheng","family":"Zhao","sequence":"additional","affiliation":[]},{"given":"Yiran","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.1118"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2014.6881523"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.365"},{"key":"ref13","first-page":"1313","article-title":"Asymmetry of mtj switching and its implication to stt-ram designs","author":"zhang","year":"2012","journal-title":"Design Automation Test in Europe Conference Exhibition"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629936"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105370"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/INTMAG.2015.7156644"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2198876"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228580"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691090"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2170778"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429498"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2742060.2742077"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2011.6055392"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2305695"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2010.5548848"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691091"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2032192"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.4870917"}],"event":{"name":"2015 IEEE 11th International Conference on ASIC (ASICON )","start":{"date-parts":[[2015,11,3]]},"location":"Chengdu, China","end":{"date-parts":[[2015,11,6]]}},"container-title":["2015 IEEE 11th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7506193\/7516874\/07517038.pdf?arnumber=7517038","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T12:41:08Z","timestamp":1489754468000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7517038\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/asicon.2015.7517038","relation":{},"subject":[],"published":{"date-parts":[[2015,11]]}}}