{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T01:58:55Z","timestamp":1725501535127},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/asicon.2015.7517100","type":"proceedings-article","created":{"date-parts":[[2016,7,26]],"date-time":"2016-07-26T16:38:31Z","timestamp":1469551111000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A hall sensor microsystem for current measurement used in watt-hour meter"],"prefix":"10.1109","author":[{"given":"Wenhao","family":"Xu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xunhua","family":"Guo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinling","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guoxing","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/4.585275"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2012.6411298"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2007.894902"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/0924-4247(96)80150-6"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.2307\/2369245"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.1999.776765"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2000.843919"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s110606284"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.1996.507616"}],"event":{"name":"2015 IEEE 11th International Conference on ASIC (ASICON )","start":{"date-parts":[[2015,11,3]]},"location":"Chengdu, China","end":{"date-parts":[[2015,11,6]]}},"container-title":["2015 IEEE 11th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7506193\/7516874\/07517100.pdf?arnumber=7517100","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T12:42:49Z","timestamp":1489754569000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7517100\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/asicon.2015.7517100","relation":{},"subject":[],"published":{"date-parts":[[2015,11]]}}}