{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T10:52:10Z","timestamp":1761562330104,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/asicon.2017.8252424","type":"proceedings-article","created":{"date-parts":[[2018,1,17]],"date-time":"2018-01-17T22:22:30Z","timestamp":1516227750000},"page":"112-115","source":"Crossref","is-referenced-by-count":10,"title":["Design trends in smart gate driver ICs for power MOSFETs and IGBTs"],"prefix":"10.1109","author":[{"given":"J.","family":"Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W. T.","family":"Ng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-4557-3143-5.00005-5"},{"key":"ref11","article-title":"New Ultra Fast Short Circuit Detection Method Without Using the Desaturation Process of the Power Semiconductor","volume":"8","author":"hain","year":"2016","journal-title":"PCIM Europe"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2015.7104700"},{"key":"ref13","article-title":"An Automatic IGBT Collector Current Sensing Technique via the Gate Node","volume":"8","author":"chen","year":"2016","journal-title":"PCIM Europe Nuremberg Germany"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2008.2003971"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"1602","DOI":"10.1109\/APEC.2008.4522939","article-title":"A smart gate drive with self-diagnosis for power MOSFETs and IGBTs","author":"lihua","year":"2008","journal-title":"Twenty-Third Annual IEEE Applied Power Electronics Conference and Exposition"},{"key":"ref16","first-page":"2430","article-title":"An integrated segmented gate driver with adjustable driving capability","author":"fomani","year":"2010","journal-title":"IEEE Energy Conversion Congress and Exposition"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2013.6694400"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2014.6856012"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2016.7854892"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2587340"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISMVL.2016.59"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2278794"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2014.6803710"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2207463"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2007.876895"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2257638"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.810654"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2017.7974107"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-4557-3143-5.00007-9"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/SMICND.2003.1252427"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2016.7520864"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/SPEEDAM.2012.6264556"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2566612"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2014.6953948"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.23919\/ISPSD.2017.7988912"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/S3S.2015.7333480"}],"event":{"name":"2017 IEEE 12th International Conference on ASIC (ASICON)","start":{"date-parts":[[2017,10,25]]},"location":"Guiyang","end":{"date-parts":[[2017,10,28]]}},"container-title":["2017 IEEE 12th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8240668\/8252386\/08252424.pdf?arnumber=8252424","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,9]],"date-time":"2019-10-09T13:29:17Z","timestamp":1570627757000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8252424\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/asicon.2017.8252424","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}